High angular resolution measurements of K shell x-ray emission created by electron channeling in the analytical electron microscope.

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Since the original observations by Duncumb in 1962, a number of studies have been conducted on the effects of electron channel on characteristic x-ray emission and microanalysis. Most of the recent studies have concentrated upon using the phenomenon to perform site specific distributions of impurity elements in ordered compounds using the ALCHEMI methodology. Very few studies have attempted to accurately measure the effect as a function of orientation and compare these results to theories. In this study, two dimensional high angular resolution studies of channeling enhance x-ray emission were performed and herein the results are compared to theoretical calculations of ... continued below

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5 p.

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Zaluzec, N. J. March 10, 1999.

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Since the original observations by Duncumb in 1962, a number of studies have been conducted on the effects of electron channel on characteristic x-ray emission and microanalysis. Most of the recent studies have concentrated upon using the phenomenon to perform site specific distributions of impurity elements in ordered compounds using the ALCHEMI methodology. Very few studies have attempted to accurately measure the effect as a function of orientation and compare these results to theories. In this study, two dimensional high angular resolution studies of channeling enhance x-ray emission were performed and herein the results are compared to theoretical calculations of Allen et al. All experimental measurements presented here were conducted on a Philips EM 420T analytical electron microscope. The instrument was operated in the TEM mode, at 120 kV using an LaB6 electron source. The characteristic x-ray emission was measured using an EDAX ultra thin window Si(Li) detector having a FWHM of {approximately}145 eV at Mn Km Nominal probe sizes used during the study were 200-500 nm with beam convergence half angle defined by the Condenser apertures. Control of the relative orientation of the incident probe was accomplished via direct computer control of the beam tilt coils, after the specimen was first manually oriented to an appropriate zone axis using the specimen tilt stage. Two dimensional measurements were carried out using a 128 x 100 pixel scan corresponding to an angular range of {approximately}100 by 80 mR using customized computer program running on a EDAX 9900 microanalyzer system. Careful alignment and manual optimization/adjustments of beam tilt pivot coils, minimized probe wobble during data acquisition. The effects of this were additionally mitigated due to the relative uniformity of the specimen thickness in the analyzed zone. Typical acquisition times for a complete two dimensional scan were 18-24 hours. Essential to the success of these measurements was the stability of the probe current, minimal specimen drift, and absence of hydrocarbon contamination. The latter being accomplished using argon plasma processing of the specimen (MgAl{sub 2}O{sub 4}) which was initially prepared by mechanical tripod polishing.

Physical Description

5 p.

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INIS; OSTI as DE00012375

Medium: P; Size: 5 pages

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  • Microscopy and Microanalysis '99, Portland, OR (US), 08/01/1999--08/05/1999

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  • Report No.: ANL/MSD/CP-98514
  • Grant Number: W-31109-ENG-38
  • Office of Scientific & Technical Information Report Number: 12375
  • Archival Resource Key: ark:/67531/metadc620029

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Office of Scientific & Technical Information Technical Reports

Reports, articles and other documents harvested from the Office of Scientific and Technical Information.

Office of Scientific and Technical Information (OSTI) is the Department of Energy (DOE) office that collects, preserves, and disseminates DOE-sponsored research and development (R&D) results that are the outcomes of R&D projects or other funded activities at DOE labs and facilities nationwide and grantees at universities and other institutions.

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  • March 10, 1999

Added to The UNT Digital Library

  • June 16, 2015, 7:43 a.m.

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  • April 11, 2017, 12:35 p.m.

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Zaluzec, N. J. High angular resolution measurements of K shell x-ray emission created by electron channeling in the analytical electron microscope., article, March 10, 1999; Illinois. (digital.library.unt.edu/ark:/67531/metadc620029/: accessed November 20, 2017), University of North Texas Libraries, Digital Library, digital.library.unt.edu; crediting UNT Libraries Government Documents Department.