Laser scattering detection and characterization of defects and machining damage in silicon nitride components.

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Description

It is known that surface and subsurface damage in machined silicon nitride (Si{sub 3}N{sub 4}) ceramic components can significantly affect component strength and lifetime. Because Si{sub 3}N{sub 4} may transmit some light into its subsurface, they have developed an elastic optical scattering technique to provide two-dimensional image data for detecting surface or subsurface defects and machining damage. This technique has been used to analyze diamond-ground Si{sub 3}N{sub 4} specimens subjected to various machining conditions. The results were compared with photomicroscopy data for detect characterization and were correlated with machining conditions.

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9 p.

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Sun, J. G. November 25, 1998.

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Description

It is known that surface and subsurface damage in machined silicon nitride (Si{sub 3}N{sub 4}) ceramic components can significantly affect component strength and lifetime. Because Si{sub 3}N{sub 4} may transmit some light into its subsurface, they have developed an elastic optical scattering technique to provide two-dimensional image data for detecting surface or subsurface defects and machining damage. This technique has been used to analyze diamond-ground Si{sub 3}N{sub 4} specimens subjected to various machining conditions. The results were compared with photomicroscopy data for detect characterization and were correlated with machining conditions.

Physical Description

9 p.

Notes

OSTI as DE00011139

Medium: P; Size: 9 pages

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  • 1st China International Conference on High-Performance Ceramics, Beijing (CN), 10/31/1998--11/03/1998

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  • Report No.: ANL/ET/CP-97741
  • Grant Number: W-31109-ENG-38
  • Office of Scientific & Technical Information Report Number: 11139
  • Archival Resource Key: ark:/67531/metadc619749

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Office of Scientific & Technical Information Technical Reports

Reports, articles and other documents harvested from the Office of Scientific and Technical Information.

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  • November 25, 1998

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  • June 16, 2015, 7:43 a.m.

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  • April 11, 2017, 7:38 p.m.

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Sun, J. G. Laser scattering detection and characterization of defects and machining damage in silicon nitride components., article, November 25, 1998; Illinois. (digital.library.unt.edu/ark:/67531/metadc619749/: accessed December 16, 2017), University of North Texas Libraries, Digital Library, digital.library.unt.edu; crediting UNT Libraries Government Documents Department.