Thermal vacuum tests of a five watt pseudo chip in a SEM-X electronic module clamped in a satellite box

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Description

A five watt pseudo chip in the middle of a SEM-X circuit card was tested with various heat conduction paths in a satellite type electronic box while mounted in a vacuum chamber. Previous tests showed low temperature differentials with the use of circuit board clamps. Flight hardware with thin box walls, low mass module frames, and thin heat covers were tested to determine the temperature differential at 5.0 watts as well as at lower powers. The smallest temperature differential was 23 degrees Celsius between the 5 watt pseudo chip and the cold plate.

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5 p.

Creation Information

Greenwood, W.H. & Akau, R.L. September 1, 1995.

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This article is part of the collection entitled: Office of Scientific & Technical Information Technical Reports and was provided by UNT Libraries Government Documents Department to Digital Library, a digital repository hosted by the UNT Libraries. It has been viewed 17 times . More information about this article can be viewed below.

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  • Sandia National Laboratories
    Publisher Info: Sandia National Labs., Albuquerque, NM (United States)
    Place of Publication: Albuquerque, New Mexico

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Description

A five watt pseudo chip in the middle of a SEM-X circuit card was tested with various heat conduction paths in a satellite type electronic box while mounted in a vacuum chamber. Previous tests showed low temperature differentials with the use of circuit board clamps. Flight hardware with thin box walls, low mass module frames, and thin heat covers were tested to determine the temperature differential at 5.0 watts as well as at lower powers. The smallest temperature differential was 23 degrees Celsius between the 5 watt pseudo chip and the cold plate.

Physical Description

5 p.

Notes

OSTI as DE95017865

Source

  • STAIF 96: space technology and applications international forum, Albuquerque, NM (United States), 7-11 Jan 1996

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Identifier

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  • Other: DE95017865
  • Report No.: SAND--95-1993C
  • Report No.: CONF-960109--1
  • Grant Number: AC04-94AL85000
  • Office of Scientific & Technical Information Report Number: 125182
  • Archival Resource Key: ark:/67531/metadc619637

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Office of Scientific & Technical Information Technical Reports

Reports, articles and other documents harvested from the Office of Scientific and Technical Information.

Office of Scientific and Technical Information (OSTI) is the Department of Energy (DOE) office that collects, preserves, and disseminates DOE-sponsored research and development (R&D) results that are the outcomes of R&D projects or other funded activities at DOE labs and facilities nationwide and grantees at universities and other institutions.

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Creation Date

  • September 1, 1995

Added to The UNT Digital Library

  • June 16, 2015, 7:43 a.m.

Description Last Updated

  • April 14, 2016, 1:34 p.m.

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Greenwood, W.H. & Akau, R.L. Thermal vacuum tests of a five watt pseudo chip in a SEM-X electronic module clamped in a satellite box, article, September 1, 1995; Albuquerque, New Mexico. (digital.library.unt.edu/ark:/67531/metadc619637/: accessed October 22, 2018), University of North Texas Libraries, Digital Library, digital.library.unt.edu; crediting UNT Libraries Government Documents Department.