Interfacial effects in multilayers

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There are many physical characterization approaches which evaluate a limited set of structural elements in multilayers: they study a single interface; they study a single layer of material; they study a very small sample of a multilayer. On a broader basis, the interference phenomena on which the performance of x-ray optic multilayers is based integrates over the full area/volume of the multilayer illuminated. In order to gain understanding of the impact of imperfections on multilayer performance it is necessary to develop an experimental approach that provides detailed information about the effects of interfaces in the multilayer obtained when the multilayer ... continued below

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568 Kilobytes pages

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Barbee, T. W. June 28, 1999.

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Description

There are many physical characterization approaches which evaluate a limited set of structural elements in multilayers: they study a single interface; they study a single layer of material; they study a very small sample of a multilayer. On a broader basis, the interference phenomena on which the performance of x-ray optic multilayers is based integrates over the full area/volume of the multilayer illuminated. In order to gain understanding of the impact of imperfections on multilayer performance it is necessary to develop an experimental approach that provides detailed information about the effects of interfaces in the multilayer obtained when the multilayer is being applied in a manner directly related to application. Additionally, it is also of interest to determine the breadth of application of any such experimental approach to the general study of interfaces in solids. The primary goal in this research was to develop an experimental methodology to quantitatively characterize both the physical and electronic characteristics of interfaces in multilayer structures. The approach was to fabricate multilayers from three elements so that one monolayer or less thick ''marker layers'' were selectively deposited on a given set interfaces in the multilayer. These ''marker layers'' could then interrogated by scattering and fluorescence techniques for their distribution, for their atomic arrangements relative to the thicker layers and for their electronic state at the interfaces as affected by the thicker layer materials. WC/C multilayers with one monolayer (2.33 {angstrom}) of tantalum at the WC on C and the C on WC interfaces were fabricated and studied. Ta was selected as the marker layer material as its L{sub 3} absorption edge is at 9879 eV, more than 300 eV less than the W L{sub 3} edge at 10200 eV. Reflectivities at 9850 eV, 9879 eV and 9950 eV were measured: Ta layers standing wave fluorescence on the multilayer Bragg peak at these energies and fluorescence EXAFS of the Ta layers were also obtained. These results are modeled and the implications of the results for x-ray optic structures and the study of buried interfaces in solids discussed.

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568 Kilobytes pages

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  • Other Information: PBD: 28 Jun 1999

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  • Report No.: UCRL-ID-130783
  • Report No.: YN0100000
  • Grant Number: W-7405-ENG-48
  • DOI: 10.2172/14282 | External Link
  • Office of Scientific & Technical Information Report Number: 14282
  • Archival Resource Key: ark:/67531/metadc619541

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Reports, articles and other documents harvested from the Office of Scientific and Technical Information.

Office of Scientific and Technical Information (OSTI) is the Department of Energy (DOE) office that collects, preserves, and disseminates DOE-sponsored research and development (R&D) results that are the outcomes of R&D projects or other funded activities at DOE labs and facilities nationwide and grantees at universities and other institutions.

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  • June 28, 1999

Added to The UNT Digital Library

  • June 16, 2015, 7:43 a.m.

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  • May 6, 2016, 1:30 p.m.

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Barbee, T. W. Interfacial effects in multilayers, report, June 28, 1999; California. (digital.library.unt.edu/ark:/67531/metadc619541/: accessed December 16, 2017), University of North Texas Libraries, Digital Library, digital.library.unt.edu; crediting UNT Libraries Government Documents Department.