Sub-nanometer interferometry and precision turning for large optical fabrication

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At Lawrence Livermore National Laboratory (LLNL), we have the unique combination of precision turning and metrology capabilities critical to the fabrication of large optical elements. We have developed a self-referenced interferometer to measure errors in aspheric optics to sub- nanometer accuracy over 200-millimeter apertures, a dynamic range of 5{approximately}10. We have utilized diamond turning to figure optics for X-ray to IR wavelengths and, with fast-tool-servo technology, can move optical segments from off-axis to on-axis. With part capacities to 2.3-meters diameter and the metrology described above, segments of very large, ultra-lightweight mirrors can potentially be figured to final requirements. precision of ... continued below

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Klingmann, J L & Sommargren, G E April 1, 1999.

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Description

At Lawrence Livermore National Laboratory (LLNL), we have the unique combination of precision turning and metrology capabilities critical to the fabrication of large optical elements. We have developed a self-referenced interferometer to measure errors in aspheric optics to sub- nanometer accuracy over 200-millimeter apertures, a dynamic range of 5{approximately}10. We have utilized diamond turning to figure optics for X-ray to IR wavelengths and, with fast-tool-servo technology, can move optical segments from off-axis to on-axis. With part capacities to 2.3-meters diameter and the metrology described above, segments of very large, ultra-lightweight mirrors can potentially be figured to final requirements. precision of diamond-turning will carryover although the surface finish may be degraded. Finally, the most critical component of a fabrication process is the metrology that enables an accurate part. Well characterized machines are very repeatable and part accuracy must come from proper metrology. A self- referencing interferometer has been developed that can measure accurately to sub-nanometer values. As with traditional interferometers, measurements are fast and post- processed data provides useful feedback to the user. The simplicity of the device allows it to be used on large optics and systems.

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1.2 Megabytes pages

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  • Ultra Lightweight Space Optics, Napa, CA (US), 03/24/1999--03/25/1999

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  • Report No.: UCRL-JC-134052
  • Report No.: YN0100000
  • Grant Number: W-7405-ENG-48
  • Office of Scientific & Technical Information Report Number: 12168
  • Archival Resource Key: ark:/67531/metadc619321

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  • April 1, 1999

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  • June 16, 2015, 7:43 a.m.

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  • May 6, 2016, 4:07 p.m.

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Klingmann, J L & Sommargren, G E. Sub-nanometer interferometry and precision turning for large optical fabrication, article, April 1, 1999; California. (digital.library.unt.edu/ark:/67531/metadc619321/: accessed September 20, 2017), University of North Texas Libraries, Digital Library, digital.library.unt.edu; crediting UNT Libraries Government Documents Department.