Cleaning techniques for applied-B ion diodes

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Description

Measurements and theoretical considerations indicate that the lithium-fluoride (LiF) lithium ion source operates by electron-assisted field-desorption, and provides a pure lithium beam for 10--20 ns. Evidence on both the SABRE (1 TW) and PBFA-II (20 TW) accelerators indicates that the lithium beam is replaced by a beam of protons, and carbon resulting from electron thermal desorption of hydrocarbon surface and bulk contamination with subsequent avalanche ionization. Appearance of contaminant ions in the beam is accompanied by rapid impedance collapse, possibly resulting from loss of magnetic insulation in the rapidly expanding and ionizing, neutral layer. Electrode surface and source substrate cleaning ... continued below

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10 p.

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Cuneo, M.E.; Menge, P.R. & Hanson, D.L. September 1, 1995.

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  • Sandia National Laboratories
    Publisher Info: Sandia National Labs., Albuquerque, NM (United States)
    Place of Publication: Albuquerque, New Mexico

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Description

Measurements and theoretical considerations indicate that the lithium-fluoride (LiF) lithium ion source operates by electron-assisted field-desorption, and provides a pure lithium beam for 10--20 ns. Evidence on both the SABRE (1 TW) and PBFA-II (20 TW) accelerators indicates that the lithium beam is replaced by a beam of protons, and carbon resulting from electron thermal desorption of hydrocarbon surface and bulk contamination with subsequent avalanche ionization. Appearance of contaminant ions in the beam is accompanied by rapid impedance collapse, possibly resulting from loss of magnetic insulation in the rapidly expanding and ionizing, neutral layer. Electrode surface and source substrate cleaning techniques are being developed on the SABRE accelerator to reduce beam contamination, plasma formation, and impedance collapse. We have increased lithium current density a factor of 3 and lithium energy a factor of 5 through a combination of in-situ surface and substrate coatings, impermeable substrate coatings, and field profile modifications.

Physical Description

10 p.

Notes

OSTI as DE95017882

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  • 10. Institute of Electrical and Electronics Engineers (IEEE) pulsed power conference, Albuquerque, NM (United States), 10-13 Jul 1995

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  • Other: DE95017882
  • Report No.: SAND--94-3136C
  • Report No.: CONF-950750--38
  • Grant Number: AC04-94AL85000
  • Office of Scientific & Technical Information Report Number: 112933
  • Archival Resource Key: ark:/67531/metadc619211

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  • September 1, 1995

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  • June 16, 2015, 7:43 a.m.

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  • April 13, 2016, 1:06 p.m.

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Cuneo, M.E.; Menge, P.R. & Hanson, D.L. Cleaning techniques for applied-B ion diodes, article, September 1, 1995; Albuquerque, New Mexico. (digital.library.unt.edu/ark:/67531/metadc619211/: accessed September 25, 2017), University of North Texas Libraries, Digital Library, digital.library.unt.edu; crediting UNT Libraries Government Documents Department.