The Total Quality Approach to Transistor Testing and Device Allocation Page: II
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Novak, Jarry V., The Total Quality Approach to Transis-
tor Testing and Device Allocation. Doctor of Philosophy
(Management), May, 1971, 226 pp., 20 tables, 10 illustrations,
bibliography, 37 titles.
Any complete product leaving the transistor production
line and exhibiting some electrical characteristics qualifies
as a transistor. But only those products exhibiting the
exact characteristics specified by the customer qualify as
devices. This study is concerned with the problems arising
from converting transistors into devices. It focuses on ex-
isting conversion methods which because of their device
orientation render less than attainable results.
The purpose of this study is to design a transistor
conversion system oriented toward quality categories rather
than toward devices. Underlying this purpose are two work-
ing hypotheses: First, quality categories can be developed
by capitalizing on transistor total quality and convertibility;
second, a transistor conversion system oriented toward quality
categories is superior to existing device-oriented methods.
The first hypothesis was validated by verifying the
existence- and the significance of transistor total quality
and convertibility and by using these features in developing
a quality-category model. As demonstrated, the total quality
of each transistor exceeds the quality required in individual
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Novak, Jarry Vaclav. The Total Quality Approach to Transistor Testing and Device Allocation, dissertation, May 1971; Denton, Texas. (digital.library.unt.edu/ark:/67531/metadc278508/m1/2/: accessed November 15, 2018), University of North Texas Libraries, Digital Library, digital.library.unt.edu; .