The Total Quality Approach to Transistor Testing and Device Allocation Page: 1
The following text was automatically extracted from the image on this page using optical character recognition software:
THE TOTAL QUALITY APPROACH TO TRANSISTOR TESTING
AND DEVICE ALLOCATION
Presented to the Graduate Council of the
North Texas State University in Partial
Fulfillment of the Requirements
For the Degree of
DOCTOR OF PHILOSOPHY
Jarry V. Novak, B.S.B.A., M.B.A.
Here’s what’s next.
This dissertation can be searched. Note: Results may vary based on the legibility of text within the document.
Tools / Downloads
Get a copy of this page or view the extracted text.
Citing and Sharing
Basic information for referencing this web page. We also provide extended guidance on usage rights, references, copying or embedding.
Reference the current page of this Dissertation.
Novak, Jarry Vaclav. The Total Quality Approach to Transistor Testing and Device Allocation, dissertation, May 1971; Denton, Texas. (digital.library.unt.edu/ark:/67531/metadc278508/m1/1/: accessed November 12, 2018), University of North Texas Libraries, Digital Library, digital.library.unt.edu; .