Charge Collection Studies on Integrated Circuit Test Structures using Heavy-Ion Microbeams and MEDICI Simulation Calculations Page: Title Page
The following text was automatically extracted from the image on this page using optical character recognition software:
CHARGE COLLECTION STUDIES ON INTEGRATED CIRCUIT
TEST STRUCTURES USING HEAVY-ION MICROBEAMS
AND MEDICI SIMULATION CALCULATIONS
Baonian Guo, B.S., M.S.-Physics, M.S.-Materials Science
Dissertation Prepared for the Degree of
DOCTOR OF PHILOSOPHY
UNIVERSITY OF NORTH TEXAS
Floyd D. McDaniel, Major Professor and Coordinator of
the program in Physics Ph.D.
Jerome L. Duggan, Minor Professor
Barney L. Doyle, Committee Member
Samuel E. Matteson, Committee Member and Chair of the
Department of Physics
Duncan L. Weathers, Committee Member and Graduate
Advisor of the Department of Physics
C. Neal Tate, Dean of the Robert B. Toulouse School of
Here’s what’s next.
This dissertation can be searched. Note: Results may vary based on the legibility of text within the document.
Citing and Sharing
Basic information for referencing this web page. We also provide extended guidance on usage rights, references, copying or embedding.
Reference the current page of this Dissertation.
Guo, Baonian. Charge Collection Studies on Integrated Circuit Test Structures using Heavy-Ion Microbeams and MEDICI Simulation Calculations, dissertation, May 2000; Denton, Texas. (digital.library.unt.edu/ark:/67531/metadc2469/m1/1/: accessed June 23, 2017), University of North Texas Libraries, Digital Library, digital.library.unt.edu; .