Charge Collection Studies on Integrated Circuit Test Structures using Heavy-Ion Microbeams and MEDICI Simulation Calculations Page: Title Page

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Guo, Baonian. Charge Collection Studies on Integrated Circuit Test Structures using Heavy-Ion Microbeams and MEDICI Simulation Calculations, dissertation, May 2000; Denton, Texas. (digital.library.unt.edu/ark:/67531/metadc2469/m1/1/: accessed February 22, 2017), University of North Texas Libraries, Digital Library, digital.library.unt.edu; .