Submillimeter and microwave residual losses in epitaxial films of Y-Ba-Cu-O and Tl-Ca-Ba-Cu-O

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We have used a novel bolometric technique and a resonant technique to obtain accurate submillimeter and microwave residual loss data for epitaxial thin films of YBa{sub 2}Cu{sub 3}O{sub 7}, Tl{sub 2}Ca{sub 2}Ba{sub 2}Cu{sub 3}O{sub 10} and Tl{sub 2}CaBa{sub 2}Cu{sub 2}O{sub 8}. For all films we obtain good agreement between the submillimeter and microwave data, with the residual losses in both the Y-Ba-Cu-O and Tl-Ca-Ba-Cu-O films scaling approximately as frequency squared below {approximately} 1 THz. We are able to fit the losses in the Y-Ba-Cu-O films to a weakly coupled grain model for the a-b plane conductivity, in good agreement with ... continued below

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31 pages

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Miller, D.; Richards, P. L. (Lawrence Berkeley Lab., CA (United States)); Garrison, S. M.; Newman, N. (Conductus, Inc., Sunnyvale, CA (United States)); Eom, C. B.; Geballe, T. H. (Stanford Univ., CA (United States). Dept. of Applied Physics) et al. March 1, 1992.

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We have used a novel bolometric technique and a resonant technique to obtain accurate submillimeter and microwave residual loss data for epitaxial thin films of YBa{sub 2}Cu{sub 3}O{sub 7}, Tl{sub 2}Ca{sub 2}Ba{sub 2}Cu{sub 3}O{sub 10} and Tl{sub 2}CaBa{sub 2}Cu{sub 2}O{sub 8}. For all films we obtain good agreement between the submillimeter and microwave data, with the residual losses in both the Y-Ba-Cu-O and Tl-Ca-Ba-Cu-O films scaling approximately as frequency squared below {approximately} 1 THz. We are able to fit the losses in the Y-Ba-Cu-O films to a weakly coupled grain model for the a-b plane conductivity, in good agreement with results from a Kramers-Kronig analysis of the loss data. We observe strong phonon structure in the Tl-Ca-Ba-Cu-O films for frequencies between 2 and 21 THz, and are unable to fit these losses to the simple weakly coupled grain model. This is in strong contrast to the case for other high {Tc} superconductors such as YBa{sub 2}Cu{sub 3}O{sub 7}, where phonon structure observed in ceramic samples is absent in epitaxial oriented films and crystals because of the electronic screening due to the high conductivity of the a-b planes.

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31 pages

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OSTI; NTIS; GPO Dep.

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  • 2. symposium on high temperature superconductors in high frequency fields, Santa Fe, NM (United States), 1-3 Apr 1992

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  • Other: DE92017075
  • Report No.: LBL-32148
  • Report No.: CONF-9204169--1
  • Grant Number: AC03-76SF00098
  • Office of Scientific & Technical Information Report Number: 7282597
  • Archival Resource Key: ark:/67531/metadc1446078

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  • March 1, 1992

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  • Feb. 10, 2019, 8:45 p.m.

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  • June 4, 2019, 11:45 a.m.

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Miller, D.; Richards, P. L. (Lawrence Berkeley Lab., CA (United States)); Garrison, S. M.; Newman, N. (Conductus, Inc., Sunnyvale, CA (United States)); Eom, C. B.; Geballe, T. H. (Stanford Univ., CA (United States). Dept. of Applied Physics) et al. Submillimeter and microwave residual losses in epitaxial films of Y-Ba-Cu-O and Tl-Ca-Ba-Cu-O, article, March 1, 1992; California. (https://digital.library.unt.edu/ark:/67531/metadc1446078/: accessed August 23, 2019), University of North Texas Libraries, Digital Library, https://digital.library.unt.edu; crediting UNT Libraries Government Documents Department.