Computer controlled data measurement and analysis system used for measuring switching parameters of semiconductors. [Employs HP 2114B minicomputer; reports contain all applicable coding in assembly language]

PDF Version Also Available for Download.

Description

A computer-controlled data acquisition system which was employed to measure the threshold switching parameters of amorphous semiconductors is described. This system is capable of measuring the delay time required for a sample to switch, the electrical energy put into a sample and the charge passing through it during the delay time, and its ambient temperature. With this equipment an experimenter is able to control the magnitude and maximum duration of the voltage applied to a sample, the time interval between applications of voltage, and the load resistor in series with a sample. An HP 2114B minicomputer provides control and analysis ... continued below

Physical Description

Pages: 197

Creation Information

Culp, C. H. & Eckels, D. E. January 1, 1976.

Context

This report is part of the collection entitled: Office of Scientific & Technical Information Technical Reports and was provided by UNT Libraries Government Documents Department to Digital Library, a digital repository hosted by the UNT Libraries. More information about this report can be viewed below.

Who

People and organizations associated with either the creation of this report or its content.

Publisher

Provided By

UNT Libraries Government Documents Department

Serving as both a federal and a state depository library, the UNT Libraries Government Documents Department maintains millions of items in a variety of formats. The department is a member of the FDLP Content Partnerships Program and an Affiliated Archive of the National Archives.

Contact Us

What

Descriptive information to help identify this report. Follow the links below to find similar items on the Digital Library.

Description

A computer-controlled data acquisition system which was employed to measure the threshold switching parameters of amorphous semiconductors is described. This system is capable of measuring the delay time required for a sample to switch, the electrical energy put into a sample and the charge passing through it during the delay time, and its ambient temperature. With this equipment an experimenter is able to control the magnitude and maximum duration of the voltage applied to a sample, the time interval between applications of voltage, and the load resistor in series with a sample. An HP 2114B minicomputer provides control and analysis capabilities for this system. Basically, this apparatus is a constant voltage pulse generator and signal processor. Major modules of this system are a transistorized high voltage switch, a digitally controlled high voltage resistor and power supply, a low-thermal-noise input-scanner, a precision timer, and two analog integrators. The amplitude of a voltage pulse can be varied from 0V to 1 kV and the maximum duration can be varied from 10 ..mu..s to 300 s. During the voltage pulse, a signal which represents the current through a sample is processed by analog integrators and signal multipliers. If the sample switches to a low-resistance state during a voltage pulse, this equipment automatically detects the event and removes the voltage from the sample to prevent sample deterioration. Following the voltage pulse, a teletypewriter prints the raw data from the integrators, power supply, and timer and the calculated values of the charge and energy input. 44 figures, 2 tables. (auth)

Physical Description

Pages: 197

Notes

Dep. NTIS

Language

Item Type

Identifier

Unique identifying numbers for this report in the Digital Library or other systems.

  • Report No.: IS-3691
  • Grant Number: W-7405-ENG-82
  • DOI: 10.2172/7364343 | External Link
  • Office of Scientific & Technical Information Report Number: 7364343
  • Archival Resource Key: ark:/67531/metadc1445069

Collections

This report is part of the following collection of related materials.

Office of Scientific & Technical Information Technical Reports

Reports, articles and other documents harvested from the Office of Scientific and Technical Information.

Office of Scientific and Technical Information (OSTI) is the Department of Energy (DOE) office that collects, preserves, and disseminates DOE-sponsored research and development (R&D) results that are the outcomes of R&D projects or other funded activities at DOE labs and facilities nationwide and grantees at universities and other institutions.

What responsibilities do I have when using this report?

When

Dates and time periods associated with this report.

Creation Date

  • January 1, 1976

Added to The UNT Digital Library

  • Feb. 10, 2019, 8:45 p.m.

Usage Statistics

When was this report last used?

Yesterday: 0
Past 30 days: 1
Total Uses: 1

Interact With This Report

Here are some suggestions for what to do next.

Start Reading

PDF Version Also Available for Download.

International Image Interoperability Framework

IIF Logo

We support the IIIF Presentation API

Culp, C. H. & Eckels, D. E. Computer controlled data measurement and analysis system used for measuring switching parameters of semiconductors. [Employs HP 2114B minicomputer; reports contain all applicable coding in assembly language], report, January 1, 1976; United States. (https://digital.library.unt.edu/ark:/67531/metadc1445069/: accessed March 24, 2019), University of North Texas Libraries, Digital Library, https://digital.library.unt.edu; crediting UNT Libraries Government Documents Department.