Nondestructive Performance Characterization Techniques for Module Reliability Metadata

Metadata describes a digital item, providing (if known) such information as creator, publisher, contents, size, relationship to other resources, and more. Metadata may also contain "preservation" components that help us to maintain the integrity of digital files over time.

Title

  • Main Title Nondestructive Performance Characterization Techniques for Module Reliability

Creator

  • Author: Emery, K.
    Creator Type: Personal

Contributor

  • Sponsor: United States. Department of Energy.
    Contributor Type: Organization
    Contributor Info: USDOE

Publisher

  • Name: National Renewable Energy Laboratory (U.S.)
    Place of Publication: Golden, Colorado
    Additional Info: National Renewable Energy Laboratory (NREL), Golden, CO.

Date

  • Creation: 2003-05-01

Language

  • English

Description

  • Content Description: This paper describes nondestructive characterization techniques for module reliability. These techniques include light and dark current versus voltage and related analysis such as resistance, diode quality factor, and dark current. The use of the NREL laser scanner at zero volts and forward bias is also described as a technique to uncover cracks, shunts, and open-circuit regions in a module. Quantum-efficiency measurements of isolated cells or regions in a module are also possible. The interpretation of laser-scanning data is enhanced by hot-spot testing with an infrared camera or thermographic paper. Specialized nondestructive techniques have also been developed to determine the shunt resistance of individual cells in a module by selective shading of cells under sunlight. Ultraviolet fluorescence and reflectivity measurements at NREL have proven useful in evaluating encapsulant stability.
  • Physical Description: 7 pp.

Subject

  • Keyword: Quantum Efficiency
  • Keyword: Hot Spots
  • Keyword: Laser Scanning
  • Keyword: Shading
  • Keyword: Nondestructive
  • Keyword: Bypasses
  • Keyword: Fluorescence
  • Keyword: Hot Spots
  • STI Subject Categories: 42 Engineering
  • Keyword: Module Reliability
  • STI Subject Categories: 14 Solar Energy
  • Keyword: Current-Voltage
  • Keyword: Module Reliability
  • Keyword: Reliability
  • Keyword: Lasers
  • Keyword: Laser Scanning
  • Keyword: Cameras
  • Keyword: Characterization
  • Keyword: Quantum Efficiency
  • Keyword: Testing Characterization
  • Keyword: Quality Factor
  • Keyword: Solar Energy - Photovoltaics
  • Keyword: Reflectivity
  • Keyword: Stability
  • Keyword: Nondestructive
  • Keyword: Current-Voltage
  • Keyword: Performance

Source

  • Conference: Presented at the National Center for Photovoltaics and Solar Program Review Meeting, 24-26 March 2003, Denver, Colorado

Collection

  • Name: Office of Scientific & Technical Information Technical Reports
    Code: OSTI

Institution

  • Name: UNT Libraries Government Documents Department
    Code: UNTGD

Resource Type

  • Article

Format

  • Text

Identifier

  • Report No.: NREL/CP-520-33573
  • Grant Number: AC36-99-GO10337
  • Office of Scientific & Technical Information Report Number: 15004257
  • Archival Resource Key: ark:/67531/metadc1406911