PXAMS -- Projectile X ray AMS: X ray yields and applications

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Characteristic x rays have recently been explored as a method for the detection and identification of ions in accelerator mass spectrometry (AMS). After analysis in the AMS spectrometer, the ions stop in an appropriately chosen target and the induced x rays identify the ions by atomic number. For the application of AMS to higher mass isotopes, characteristic x rays allow significantly better discrimination of competing atomic isobars than is possible using energy loss detectors. Characteristic x rays also show promise as a convenient component in hybrid detection systems. Measurements of x ray yields are presented for Si, Fe, Ni, Se, ... continued below

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14 p.

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McAninch, J. E.; Bench, G. S.; Freeman, S. P. H. T.; Roberts, M. L.; Southon, J. R.; Vogel, J. S. et al. October 7, 1994.

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Description

Characteristic x rays have recently been explored as a method for the detection and identification of ions in accelerator mass spectrometry (AMS). After analysis in the AMS spectrometer, the ions stop in an appropriately chosen target and the induced x rays identify the ions by atomic number. For the application of AMS to higher mass isotopes, characteristic x rays allow significantly better discrimination of competing atomic isobars than is possible using energy loss detectors. Characteristic x rays also show promise as a convenient component in hybrid detection systems. Measurements of x ray yields are presented for Si, Fe, Ni, Se, Mo, and Pd ions of 0.5--2 MeV/AMU. The yields rise by more than a factor of 10 over this energy range, and approach 1 x-ray per incident ion at 2 MeV/AMU for the lighter ions. Preliminary work on the application of PXAMS to the detection of {sup 79}Se is described.

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14 p.

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OSTI; NTIS; GPO Dep.

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  • 13. international conference on the application of accelerators in research and industry,Denton, TX (United States),7-10 Nov 1994

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  • Other: DE95006438
  • Report No.: UCRL-JC--118859
  • Report No.: CONF-941129--13
  • Grant Number: W-7405-ENG-48
  • DOI: 10.2172/10118271 | External Link
  • Office of Scientific & Technical Information Report Number: 10118271
  • Archival Resource Key: ark:/67531/metadc1280921

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  • October 7, 1994

Added to The UNT Digital Library

  • Oct. 12, 2018, 6:44 a.m.

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  • Nov. 12, 2018, 6:12 p.m.

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McAninch, J. E.; Bench, G. S.; Freeman, S. P. H. T.; Roberts, M. L.; Southon, J. R.; Vogel, J. S. et al. PXAMS -- Projectile X ray AMS: X ray yields and applications, report, October 7, 1994; California. (https://digital.library.unt.edu/ark:/67531/metadc1280921/: accessed March 26, 2019), University of North Texas Libraries, Digital Library, https://digital.library.unt.edu; crediting UNT Libraries Government Documents Department.