Scratch Depth Measurement Methods

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Description

Judging scratch depth or surface roughness by unaided visual inspection under controlled conditions, while rapid and popular, is not quantitative. Comparison methods improve reproducibility but are generally not applicable to evaluation of depths of single widely spaced scratches. Stylus-type contour recorders yield valuable scratch contour data but may themselves plow through soft materials and fine details. Depth measuring microscopes are particularly applicable to measurement of pinhole depth but do not graphically reveal profiles and provide only a small field of view. The comparatively large field of view and graphic display of contour provided by profile microscopes make them particularly suitable … continued below

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9 pages : illustrations

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Brenden, B.B. February 26, 1959.

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This report is part of the collection entitled: TRAIL Microcard Collection and was provided by the UNT Libraries Government Documents Department to the UNT Digital Library, a digital repository hosted by the UNT Libraries. It has been viewed 61 times, with 10 in the last month. More information about this report can be viewed below.

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Description

Judging scratch depth or surface roughness by unaided visual inspection under controlled conditions, while rapid and popular, is not quantitative. Comparison methods improve reproducibility but are generally not applicable to evaluation of depths of single widely spaced scratches. Stylus-type contour recorders yield valuable scratch contour data but may themselves plow through soft materials and fine details. Depth measuring microscopes are particularly applicable to measurement of pinhole depth but do not graphically reveal profiles and provide only a small field of view. The comparatively large field of view and graphic display of contour provided by profile microscopes make them particularly suitable for evaluation scratch depth as well as surface roughness. A HAPO-constructed instrument has demonstrated an accuracy of +/- 50 micro inches in the range of 50 to 15,000 micro-inches scratch depth. It is a pocket-sized, portable, and can be used on horizontal and vertical surfaces by untrained persons with only brief instruction.

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9 pages : illustrations

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Digitized from microopaque cards (1).

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  • SuDoc Number: Y 3.At 7:22/HW-59410
  • Report No.: HW-59410
  • Accession or Local Control No: metadc1255018
  • Archival Resource Key: ark:/67531/metadc1255018

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TRAIL Microcard Collection

Imaged from microcard, these technical reports describe research performed for U.S. government agencies from the 1930s to the 1960s. The reports were provided by the Technical Report Archive and Image Library (TRAIL).

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The Technical Report Archive & Image Library (TRAIL) identifies, acquires, catalogs, digitizes and provides unrestricted access to U.S. government agency technical reports. The mission of TRAIL is to ensure preservation, discoverability, and persistent open access to government technical publications regardless of form or format.

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  • February 26, 1959

Added to The UNT Digital Library

  • Feb. 5, 2022, 6:49 p.m.

Description Last Updated

  • Jan. 31, 2023, 1:45 p.m.

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Brenden, B.B. Scratch Depth Measurement Methods, report, February 26, 1959; Washington D.C.. (https://digital.library.unt.edu/ark:/67531/metadc1255018/: accessed May 15, 2026), University of North Texas Libraries, UNT Digital Library, https://digital.library.unt.edu; crediting UNT Libraries Government Documents Department.

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