Finite Element Analysis of the Distortion of a Crystal Monochromator From Synchrotron Radiation Thermal LoadingperEdwards, W. R.perHoyer, E. H.perThompson, A. C.Lawrence Berkeley Lab., CA (USA)CaliforniaLawrence Berkeley Laboratory1985-10engThe first crystal of the Brown-Hower x-ray monochromator of the LBL-EXXON 54 pole wiggler beamline at Stanford Synchrotron Radiation Laboratory (SSRL) is subjected to intense synchrotron radiation. To provide an accurate thermal/structural analysis of the existing monochromator design, a finite element analysis (FEA) was performed. A very high and extremely localized heat flux is incident on the Si (220) crystal. The crystal, which possesses pronouncedly temperature-dependent orthotropic properties, in combination with the localized heat load, make the analysis ideally suited for finite element techniques. Characterization of the incident synchrotron radiation is discussed, followed by a review of the techniques employed in modeling the monochromator and its thermal/structural boundary conditions. The results of the finite element analysis, three-dimensional temperature distributions, surface displacements and slopes, and stresses, in the area of interest, are presented. Lastly, the effects these results have on monochromator output flux and resolution are examined.Pages: 12Numerical SolutionElementsX-Ray Spectroscopy43 Particle AcceleratorsMonochromatorsSemimetalsRadiation SourcesSynchrotron Radiation SourcesSpectroscopy 440300* -- Miscellaneous Instruments-- (-1989)Finite Element MethodSiliconResolution430303 -- Particle Accelerators-- Experimental Facilities & Equipment47 Other Instrumentation