A summary of the low angle x-ray atomic scattering factors which have been measured by the critical voltage effect in High Energy Electron Diffraction (HEED)

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A tabulated summary of all the accurate (/approximately/0.1%) low-angle x-ray atomic scattering (form) factors which have been determined by the systematic critical voltage technique in HEED is presented. For low atomic number elements (Z/approx lt/40) the low angle form factors can be significantly different to best free atom values, and so the best band structure calculated and/or x-ray measured form factors consistent with the critical voltage measurements are also indicated. At intermediate atomic numbers Zapprox. =40..-->..50 only the very low-angle form factors appear to be different to the best free atom values, and even then only by a small amount. ... continued below

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Pages: 16

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Fox, A.G. & Fisher, R.M. August 1, 1987.

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Description

A tabulated summary of all the accurate (/approximately/0.1%) low-angle x-ray atomic scattering (form) factors which have been determined by the systematic critical voltage technique in HEED is presented. For low atomic number elements (Z/approx lt/40) the low angle form factors can be significantly different to best free atom values, and so the best band structure calculated and/or x-ray measured form factors consistent with the critical voltage measurements are also indicated. At intermediate atomic numbers Zapprox. =40..-->..50 only the very low-angle form factors appear to be different to the best free atom values, and even then only by a small amount. For heavy elements (Z/approx lt/70) the best free atom form factors appear to agree very closely with the critical voltage measured values and so, in this case, critical voltage measurements give very accurate measurements of Debye-Waller factors. 48 refs.

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Pages: 16

Notes

NTIS, PC A03/MF A01 - OSTI; 1.

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  • Symposium on accuracy in structure factor measurements, Victoria, Australia, 23 Aug 1987

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  • Other: DE89006834
  • Report No.: LBL-24126
  • Report No.: CONF-8708218-1
  • Grant Number: AC03-76SF00098
  • Office of Scientific & Technical Information Report Number: 6489420
  • Archival Resource Key: ark:/67531/metadc1204742

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Office of Scientific & Technical Information Technical Reports

Reports, articles and other documents harvested from the Office of Scientific and Technical Information.

Office of Scientific and Technical Information (OSTI) is the Department of Energy (DOE) office that collects, preserves, and disseminates DOE-sponsored research and development (R&D) results that are the outcomes of R&D projects or other funded activities at DOE labs and facilities nationwide and grantees at universities and other institutions.

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  • August 1, 1987

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  • July 5, 2018, 11:11 p.m.

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  • Oct. 30, 2018, 2:07 p.m.

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Fox, A.G. & Fisher, R.M. A summary of the low angle x-ray atomic scattering factors which have been measured by the critical voltage effect in High Energy Electron Diffraction (HEED), article, August 1, 1987; California. (digital.library.unt.edu/ark:/67531/metadc1204742/: accessed November 21, 2018), University of North Texas Libraries, Digital Library, digital.library.unt.edu; crediting UNT Libraries Government Documents Department.