Electrostatic Mechanism of Emission Enhancement in Hybrid Metal-semiconductor Light-emitting Heterostructures Page: 78
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strongly inhomogeneous distribution of light emission in a small region around the
nanoparticle. Since the regions over which this intensity variation occurs are smaller
than A/2, it is not possible to resolve the inhomogeneity in emission near the NP using
far-field PL measurements. Instead, I have used near-field spectroscopy, which is
capable of resolving sub-wavelength features on the order of the width of the probe
aperture used for the measurements (see 3.6). Ideally, near-field measurements would
be done using an AFM-type NSOM instead of a fiber-probe based NSOM, which would
allow for topographical mapping of the individual pits to correlate pit positions with the
emission intensity. In the absence of this I make use of the fitting method used for near-
field measurement of InGaN/GaN samples which allows us to measure emission from
the QWs within the pits themselves.
We present the results of a near-field measurement showing enhancement from
Au NPs in Figure 5.12. The imaged 1xl micron region has two areas of pits, one of
which shows significantly enhanced emission in the vicinity of the pits. An increase in
Huang-Rhys Parameter (S 1
S0. 2 0,5
Figure 5.13 Huang-Rhys Parameter extracted via fitting the same lxi
micron area depicted in Fig 5.12
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Llopis, Antonio. Electrostatic Mechanism of Emission Enhancement in Hybrid Metal-semiconductor Light-emitting Heterostructures, dissertation, May 2012; Denton, Texas. (digital.library.unt.edu/ark:/67531/metadc115113/m1/88/: accessed May 29, 2017), University of North Texas Libraries, Digital Library, digital.library.unt.edu; .