Electrostatic Mechanism of Emission Enhancement in Hybrid Metal-semiconductor Light-emitting Heterostructures Page: 28
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tapered fiber probe tip used for measurement. AFM-style probes, on the other hand can
have AFM-quality topography, but generally sacrifice the ability to collect in the near-
field. It is possible to bypass this by having an aperture in the AFM probe tip, however
this generally increases the size of the probe and therefore reduces the topographical
For our near-field measurements I made use of a commercial JASCO NFS-330
near-field scanning optical micro-spectrometer (NSOM) using a tapered fiber probe
operating in illumination/collection mode. Fiber probe aperture diameters used varied
HeCd 325 nm
Bandpass ND . ............
Slit . Spectrometer
Probe Tip U
Figure 3.6 Schematic diagram of Near-field PL experiment. Excitation
provided by the 325 nm line of a HeCd laser is passed through a series
of filters to control the strength and then coupled into a UV fiber to couple
the excitation via to the sample via near-field interactions. The sample
returns emission via near-field interaction with the probe tip back through
the fiber, through a line filter to eliminate the laser line and to the
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Llopis, Antonio. Electrostatic Mechanism of Emission Enhancement in Hybrid Metal-semiconductor Light-emitting Heterostructures, dissertation, May 2012; Denton, Texas. (digital.library.unt.edu/ark:/67531/metadc115113/m1/38/: accessed September 22, 2017), University of North Texas Libraries, Digital Library, digital.library.unt.edu; .