Laser-based secondary neutral mass spectroscopy: Useful yield and sensitivity

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Description

A variety of problems exist in order to optimally apply resonance ionization spectroscopy (RIS) to the detection of sputtered neutral atoms, however. Several of these problems and their solutions are examined in this paper. First, the possible useful yields obtainable and the dependence of useful yield on various laser parameters for this type of sputtered neutral mass spectrometer (SNMS) are considered. Second, the choice of a mass spectrometer and its effect on the instrumental useful yield is explored in light of the unique ionization region for laser based SNMS. Finally a brief description of noise sources and their effect on ... continued below

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Pages: 31

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Young, C.E.; Pellin, M.J.; Calaway, W.F.; Joergensen, B.; Schweitzer, E.L. & Gruen, D.M. January 1, 1986.

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Description

A variety of problems exist in order to optimally apply resonance ionization spectroscopy (RIS) to the detection of sputtered neutral atoms, however. Several of these problems and their solutions are examined in this paper. First, the possible useful yields obtainable and the dependence of useful yield on various laser parameters for this type of sputtered neutral mass spectrometer (SNMS) are considered. Second, the choice of a mass spectrometer and its effect on the instrumental useful yield is explored in light of the unique ionization region for laser based SNMS. Finally a brief description of noise sources and their effect on the instrumental sensitivity is discussed. 33 refs., 12 figs.

Physical Description

Pages: 31

Notes

NTIS, PC A03/MF A01; 1.

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  • 6. international workshop on inelastic ion surface collisions, Argonne, IL, USA, 25 Aug 1986

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  • Other: DE87011464
  • Report No.: CONF-860807-4
  • Grant Number: W-31109-ENG-38
  • Office of Scientific & Technical Information Report Number: 6284579
  • Archival Resource Key: ark:/67531/metadc1113129

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  • January 1, 1986

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  • Feb. 22, 2018, 7:45 p.m.

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  • March 27, 2018, 6:38 p.m.

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Young, C.E.; Pellin, M.J.; Calaway, W.F.; Joergensen, B.; Schweitzer, E.L. & Gruen, D.M. Laser-based secondary neutral mass spectroscopy: Useful yield and sensitivity, article, January 1, 1986; United States. (digital.library.unt.edu/ark:/67531/metadc1113129/: accessed October 18, 2018), University of North Texas Libraries, Digital Library, digital.library.unt.edu; crediting UNT Libraries Government Documents Department.