Background fitting for electron energy-loss spectra

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Description

Microanalysis using electron energy loss spectroscopy is now well established. In order to assess true edge profiles and obtain integrated intensities of the inner shell ionization edges of interest, it is first necessary to subtract the background. Usually a simple inverse power law is used, but for some spectra this form does not fit well. An alternative form which results in superior fits is described.

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Pages: 8

Creation Information

Bentley, J.; Lehman, G.L. & Sklad, P.S. January 1, 1981.

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Description

Microanalysis using electron energy loss spectroscopy is now well established. In order to assess true edge profiles and obtain integrated intensities of the inner shell ionization edges of interest, it is first necessary to subtract the background. Usually a simple inverse power law is used, but for some spectra this form does not fit well. An alternative form which results in superior fits is described.

Physical Description

Pages: 8

Notes

NTIS, PC A02/MF A01.

Source

  • 3. analytical electron microscopy workshop, Vail, CO, USA, 13 Jul 1981

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  • Other: DE81027117
  • Report No.: CONF-810740-1
  • Grant Number: W-7405-ENG-26
  • Office of Scientific & Technical Information Report Number: 6127932
  • Archival Resource Key: ark:/67531/metadc1111749

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Office of Scientific & Technical Information Technical Reports

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Creation Date

  • January 1, 1981

Added to The UNT Digital Library

  • Feb. 22, 2018, 7:45 p.m.

Description Last Updated

  • March 22, 2018, 12:32 p.m.

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Bentley, J.; Lehman, G.L. & Sklad, P.S. Background fitting for electron energy-loss spectra, article, January 1, 1981; United States. (https://digital.library.unt.edu/ark:/67531/metadc1111749/: accessed March 24, 2019), University of North Texas Libraries, Digital Library, https://digital.library.unt.edu; crediting UNT Libraries Government Documents Department.