An alignment method for the Mark II silicon strip vertex detector using an x-ray beam

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A silicon strip vertex detector consisting of 36 independent detector modules is being constructed for use in the Mark II detector at the SLAC Linear Collider. This paper describes a method for determining the relative alignment of the modules to a precision better than the 5 ..mu..m intrinsic resolution of the detectors. The basic procedure involves moving the vertex detector by known amounts through a fixed, collimated x-ray beam, and using the beam position reconstructed from the detected signals to determine the relative positions and orientations of the modules. Results from tests of the method on a subset of detectors ... continued below

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Pages: 12

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Adolphsen, C.; Gratta, G.; Labarga, L.; Litke, A.; Schwarz, A.; Turala, M. et al. April 1, 1989.

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Description

A silicon strip vertex detector consisting of 36 independent detector modules is being constructed for use in the Mark II detector at the SLAC Linear Collider. This paper describes a method for determining the relative alignment of the modules to a precision better than the 5 ..mu..m intrinsic resolution of the detectors. The basic procedure involves moving the vertex detector by known amounts through a fixed, collimated x-ray beam, and using the beam position reconstructed from the detected signals to determine the relative positions and orientations of the modules. Results from tests of the method on a subset of detectors are presented. 5 refs., 11 figs.

Physical Description

Pages: 12

Notes

NTIS, PC A03/MF A01 - OSTI; 1.

Source

  • 5. European symposium on semiconductor detectors: new developments on radiation detectors, Munich, F.R. Germany, 21 Feb 1989

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  • Other: DE89014588
  • Report No.: SLAC-PUB-4961
  • Report No.: CONF-890247-3
  • Grant Number: AA03-76SF00034
  • Grant Number: AC03-83ER40103
  • Office of Scientific & Technical Information Report Number: 6082782
  • Archival Resource Key: ark:/67531/metadc1106974

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Office of Scientific & Technical Information Technical Reports

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  • April 1, 1989

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  • Feb. 22, 2018, 7:45 p.m.

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  • May 25, 2018, 1:25 p.m.

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Adolphsen, C.; Gratta, G.; Labarga, L.; Litke, A.; Schwarz, A.; Turala, M. et al. An alignment method for the Mark II silicon strip vertex detector using an x-ray beam, article, April 1, 1989; Menlo Park, California. (digital.library.unt.edu/ark:/67531/metadc1106974/: accessed August 20, 2018), University of North Texas Libraries, Digital Library, digital.library.unt.edu; crediting UNT Libraries Government Documents Department.