High-energy helium backscattering for the compositional analysis of thin-film oxide-superconductors

PDF Version Also Available for Download.

Description

Recent experiments have demonstrated that the broad elastic-scattering resonance for 8.8 MeV helium bombardment of oxygen can be exploited to measure the oxygen content of YBaCuO thin films. A potential difficulty with such measurements is distortion of the backscattering spectrum due to resonant scattering from the substrate elements, which could prevent the accurate integration of peak areas. We have measured the elastic scattering cross sections for Sr and Ti, relative to Gd, with He ions in the energy range of 2.2--8.8 MeV, and a scattering angle of 166/degree/. The results verify that resonant scattering from the substrate does not interfere ... continued below

Physical Description

Pages: 9

Creation Information

Hubbard, K.M.; Martin, J.A.; Muenchausen, R.E.; Tesmer, J.R. & Nastasi, M. January 1, 1989.

Context

This article is part of the collection entitled: Office of Scientific & Technical Information Technical Reports and was provided by UNT Libraries Government Documents Department to Digital Library, a digital repository hosted by the UNT Libraries. More information about this article can be viewed below.

Who

People and organizations associated with either the creation of this article or its content.

Provided By

UNT Libraries Government Documents Department

Serving as both a federal and a state depository library, the UNT Libraries Government Documents Department maintains millions of items in a variety of formats. The department is a member of the FDLP Content Partnerships Program and an Affiliated Archive of the National Archives.

Contact Us

What

Descriptive information to help identify this article. Follow the links below to find similar items on the Digital Library.

Description

Recent experiments have demonstrated that the broad elastic-scattering resonance for 8.8 MeV helium bombardment of oxygen can be exploited to measure the oxygen content of YBaCuO thin films. A potential difficulty with such measurements is distortion of the backscattering spectrum due to resonant scattering from the substrate elements, which could prevent the accurate integration of peak areas. We have measured the elastic scattering cross sections for Sr and Ti, relative to Gd, with He ions in the energy range of 2.2--8.8 MeV, and a scattering angle of 166/degree/. The results verify that resonant scattering from the substrate does not interfere with the high-energy compositional analysis of YBaCuO films deposited on SrTiO/sub 3/. Scattering cross sections for Ca, measured relative to Ba, have also been determined for application to the analysis of BiSrCaCuO and TlCaBaCuO films. Because of resonant scattering from Ca at beam energies above 6 MeV, two backscattering measurements are required for these materials: one at 8.8 MeV to determine the O content, and one at or below 6 MeV to determine the Ca content. Anticipating a more general applicability of this technique to the analysis of metal-oxide films, data are also presented for a number of elements, as an empirical guideline, which give the beam energies above which scattering cross sections deviate from their Rutherford values, and must be determined experimentally. 10 refs., 6 figs., 4 tabs.

Physical Description

Pages: 9

Notes

NTIS, PC A03/MF A01 - OSTI; 1.

Source

  • Materials Research Society materials analysis workshop, Albuquerque, NM, USA, 14-17 Jun 1989

Language

Item Type

Identifier

Unique identifying numbers for this article in the Digital Library or other systems.

  • Other: DE89015277
  • Report No.: LA-UR-89-2587
  • Report No.: CONF-8906186-2
  • Grant Number: W-7405-ENG-36
  • Office of Scientific & Technical Information Report Number: 5757602
  • Archival Resource Key: ark:/67531/metadc1101648

Collections

This article is part of the following collection of related materials.

Office of Scientific & Technical Information Technical Reports

Reports, articles and other documents harvested from the Office of Scientific and Technical Information.

Office of Scientific and Technical Information (OSTI) is the Department of Energy (DOE) office that collects, preserves, and disseminates DOE-sponsored research and development (R&D) results that are the outcomes of R&D projects or other funded activities at DOE labs and facilities nationwide and grantees at universities and other institutions.

What responsibilities do I have when using this article?

When

Dates and time periods associated with this article.

Creation Date

  • January 1, 1989

Added to The UNT Digital Library

  • Feb. 18, 2018, 3:59 p.m.

Description Last Updated

  • May 31, 2018, 12:49 p.m.

Usage Statistics

When was this article last used?

Congratulations! It looks like you are the first person to view this item online.

Interact With This Article

Here are some suggestions for what to do next.

Start Reading

PDF Version Also Available for Download.

International Image Interoperability Framework

IIF Logo

We support the IIIF Presentation API

Hubbard, K.M.; Martin, J.A.; Muenchausen, R.E.; Tesmer, J.R. & Nastasi, M. High-energy helium backscattering for the compositional analysis of thin-film oxide-superconductors, article, January 1, 1989; New Mexico. (digital.library.unt.edu/ark:/67531/metadc1101648/: accessed October 21, 2018), University of North Texas Libraries, Digital Library, digital.library.unt.edu; crediting UNT Libraries Government Documents Department.