Microanalysis by electron energy loss spectroscopy at 300kV

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Description

Some features of the anticipated improvements in microanalysis by electron energy loss spectroscopy (EELS) at 300 kV compared to opeation at 100kV have been studied with the use of a Philips EM430T equipped with Gatan 607 EELS and EDAX 9100/70 systems. Detailed measurements have been made on a range of specimens, with emphasis on boron nitride and silicon carbide.

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Pages: 3

Creation Information

Bentley, J. & Angelini, P. January 1, 1986.

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Description

Some features of the anticipated improvements in microanalysis by electron energy loss spectroscopy (EELS) at 300 kV compared to opeation at 100kV have been studied with the use of a Philips EM430T equipped with Gatan 607 EELS and EDAX 9100/70 systems. Detailed measurements have been made on a range of specimens, with emphasis on boron nitride and silicon carbide.

Physical Description

Pages: 3

Notes

NTIS, PC A02/MF A01; 1.

Source

  • 11. international congress on electron microscopy, Kyoto, Japan, 31 Aug 1986

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  • Other: DE86009306
  • Report No.: CONF-860854-2
  • Grant Number: AC05-84OR21400
  • Office of Scientific & Technical Information Report Number: 5755362
  • Archival Resource Key: ark:/67531/metadc1097068

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Office of Scientific & Technical Information Technical Reports

Reports, articles and other documents harvested from the Office of Scientific and Technical Information.

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Creation Date

  • January 1, 1986

Added to The UNT Digital Library

  • Feb. 18, 2018, 3:59 p.m.

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  • May 23, 2018, 12:47 p.m.

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Bentley, J. & Angelini, P. Microanalysis by electron energy loss spectroscopy at 300kV, article, January 1, 1986; Tennessee. (digital.library.unt.edu/ark:/67531/metadc1097068/: accessed August 15, 2018), University of North Texas Libraries, Digital Library, digital.library.unt.edu; crediting UNT Libraries Government Documents Department.