The application of XPS to the study of MIC

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The biotic and abiotic factors that contribute to Microbiologically Influenced Corrosion (MIC) involve the transformation of chemical species at a metal surface. X-ray Photoelectron Spectroscopy (XPS) is utilized in conjunction with conventional microbiological and Quantitative Chemical Analytical techniques to better understand the effect of environmental conditions on microbial behavior as well as the ability of bacteria to alter local environmental conditions. Specifically, the interaction of Fe, Cr, Ni, Mo ions with Desulfovibrio sp. under anoxic conditions were studied. This is the first phase of a systematic study of microbial activity and the effects of alloy elements and thermo-mechanical treatments on ... continued below

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Pages: (13 p)

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Kearns, J.R. (Allegheny Ludlum Corp., Brackenridge, PA (United States). Technical Center); Clayton, C.R.; Halada, G.P. (State Univ. of New York, Stony Brook, NY (United States). Dept. of Materials Science); Gillow, J.B. & Francis, A.J. (Brookhaven National Lab., Upton, NY (United States)) January 1, 1992.

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Description

The biotic and abiotic factors that contribute to Microbiologically Influenced Corrosion (MIC) involve the transformation of chemical species at a metal surface. X-ray Photoelectron Spectroscopy (XPS) is utilized in conjunction with conventional microbiological and Quantitative Chemical Analytical techniques to better understand the effect of environmental conditions on microbial behavior as well as the ability of bacteria to alter local environmental conditions. Specifically, the interaction of Fe, Cr, Ni, Mo ions with Desulfovibrio sp. under anoxic conditions were studied. This is the first phase of a systematic study of microbial activity and the effects of alloy elements and thermo-mechanical treatments on the MIC resistance of stainless steels.

Physical Description

Pages: (13 p)

Notes

OSTI; NTIS; GPO Dep.

Source

  • Corrosion '92 conference and exhibition, Nashville, TN (United States), 27 Apr - 1 May 1992

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  • Other: DE92010156
  • Report No.: BNL-45092
  • Report No.: CONF-920458--3
  • Grant Number: AC02-76CH00016
  • Office of Scientific & Technical Information Report Number: 5702378
  • Archival Resource Key: ark:/67531/metadc1094209

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Office of Scientific & Technical Information Technical Reports

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  • January 1, 1992

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  • Feb. 10, 2018, 10:06 p.m.

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  • April 20, 2018, 6:57 p.m.

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Kearns, J.R. (Allegheny Ludlum Corp., Brackenridge, PA (United States). Technical Center); Clayton, C.R.; Halada, G.P. (State Univ. of New York, Stony Brook, NY (United States). Dept. of Materials Science); Gillow, J.B. & Francis, A.J. (Brookhaven National Lab., Upton, NY (United States)). The application of XPS to the study of MIC, article, January 1, 1992; Upton, New York. (digital.library.unt.edu/ark:/67531/metadc1094209/: accessed December 11, 2018), University of North Texas Libraries, Digital Library, digital.library.unt.edu; crediting UNT Libraries Government Documents Department.