X-ray diffraction study of GaSb/AlSb strained-layer-superlattices grown on miscut (100) substrates

PDF Version Also Available for Download.

Description

A series of superlattices were grown by molecular beam epitaxy on (100) GaSb substrates which had been miscut by 2, 3, and 4 degrees toward the <011> direction. These superlattices were then studied by scanning all possible (444) or (511) (asymmetric) reflections with high resolution multiple-crystal x-ray diffractometry. In addition, the (400) (quasi-symmetric) reflection was scanned. From peak splittings we extracted mismatch and tilt parameters for the epitaxial unit cell. We compared our results for the non-tetragonal component of the distortion ot calculations based on the coherent strain model of Hornstra and Bartels (J. Cryst. Growth 44,513 (1978)). We find ... continued below

Physical Description

Pages: (12 p)

Creation Information

Macrander, A.T. (Argonne National Lab., IL (United States)); Schwartz, G.P.; Guiltieri, G.J. & Gilmer, G. (AT and T Bell Labs., Murray Hill, NJ (United States)) July 1, 1991.

Context

This article is part of the collection entitled: Office of Scientific & Technical Information Technical Reports and was provided by UNT Libraries Government Documents Department to Digital Library, a digital repository hosted by the UNT Libraries. It has been viewed 20 times , with 6 in the last month . More information about this article can be viewed below.

Who

People and organizations associated with either the creation of this article or its content.

Provided By

UNT Libraries Government Documents Department

Serving as both a federal and a state depository library, the UNT Libraries Government Documents Department maintains millions of items in a variety of formats. The department is a member of the FDLP Content Partnerships Program and an Affiliated Archive of the National Archives.

Contact Us

What

Descriptive information to help identify this article. Follow the links below to find similar items on the Digital Library.

Description

A series of superlattices were grown by molecular beam epitaxy on (100) GaSb substrates which had been miscut by 2, 3, and 4 degrees toward the <011> direction. These superlattices were then studied by scanning all possible (444) or (511) (asymmetric) reflections with high resolution multiple-crystal x-ray diffractometry. In addition, the (400) (quasi-symmetric) reflection was scanned. From peak splittings we extracted mismatch and tilt parameters for the epitaxial unit cell. We compared our results for the non-tetragonal component of the distortion ot calculations based on the coherent strain model of Hornstra and Bartels (J. Cryst. Growth 44,513 (1978)). We find that this model which was developed for epitaxial growth on a general (hkl) plane also describes our results for growth on vicinal (100) planes. The resolution of our data is sufficient to establish that the distortion was not purely tetragonal. A monoclinic unit cell symmetry adequately describes our results.

Physical Description

Pages: (12 p)

Notes

OSTI; NTIS; GPO Dep.

Source

  • Society of Photo-Optical Instrumentation Engineers (SPIE) meeting, San Diego, CA (United States), 21-26 Jul 1991

Language

Item Type

Identifier

Unique identifying numbers for this article in the Digital Library or other systems.

  • Other: DE92009734
  • Report No.: ANL/CP-72290
  • Report No.: CONF-9107115--73
  • Grant Number: W-31109-ENG-38
  • Office of Scientific & Technical Information Report Number: 5545037
  • Archival Resource Key: ark:/67531/metadc1092859

Collections

This article is part of the following collection of related materials.

Office of Scientific & Technical Information Technical Reports

Reports, articles and other documents harvested from the Office of Scientific and Technical Information.

Office of Scientific and Technical Information (OSTI) is the Department of Energy (DOE) office that collects, preserves, and disseminates DOE-sponsored research and development (R&D) results that are the outcomes of R&D projects or other funded activities at DOE labs and facilities nationwide and grantees at universities and other institutions.

What responsibilities do I have when using this article?

When

Dates and time periods associated with this article.

Creation Date

  • July 1, 1991

Added to The UNT Digital Library

  • Feb. 10, 2018, 10:06 p.m.

Description Last Updated

  • April 17, 2018, 3:40 p.m.

Usage Statistics

When was this article last used?

Yesterday: 0
Past 30 days: 6
Total Uses: 20

Interact With This Article

Here are some suggestions for what to do next.

Start Reading

PDF Version Also Available for Download.

International Image Interoperability Framework

IIF Logo

We support the IIIF Presentation API

Macrander, A.T. (Argonne National Lab., IL (United States)); Schwartz, G.P.; Guiltieri, G.J. & Gilmer, G. (AT and T Bell Labs., Murray Hill, NJ (United States)). X-ray diffraction study of GaSb/AlSb strained-layer-superlattices grown on miscut (100) substrates, article, July 1, 1991; Illinois. (digital.library.unt.edu/ark:/67531/metadc1092859/: accessed November 20, 2018), University of North Texas Libraries, Digital Library, digital.library.unt.edu; crediting UNT Libraries Government Documents Department.