A scanning photoelectron microscope (SPEM) at the National Synchrotron Light Source (NSLS)

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We are in the process of developing and commissioning a scanning photoelectron microscope (SPEM) at the X1A beamline of the National Synchrotron Light Source (NSLS). It is designed to make use of the Soft X-ray Undulator (SXU) at the NSLS. This high brightness source illuminates a Fresnel zone plate, which forms a focused probe, {<=} 0.2{mu}m in size, on the specimen surface. A grating monochromator selects the photon energy in the 400-800 eV range with an energy resolution of better than 1 eV. The expected flux in the focus is in the 5 {times} 10{sup 7} {minus} 10{sup 9} photons/s … continued below

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11 pages

Creation Information

Ade, Harald; Kirz, Janos; Hulbert, Steve; Johnson, Erik; Anderson, Erik & Kern, Dieter January 1, 1989.

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This article is part of the collection entitled: Office of Scientific & Technical Information Technical Reports and was provided by the UNT Libraries Government Documents Department to the UNT Digital Library, a digital repository hosted by the UNT Libraries. It has been viewed 21 times. More information about this article can be viewed below.

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  • Ade, Harald State University of New York at Stony Brook, NY (United States)
  • Kirz, Janos State University of New York at Stony Brook, NY (United States)
  • Hulbert, Steve Brookhaven National Laboratory, Upton, NY (United States)
  • Johnson, Erik Brookhaven National Laboratory, Upton, NY (United States)
  • Anderson, Erik Center for X-Ray Optics, LBL, Berkeley, California (United States)
  • Kern, Dieter IBM T. J. Watson Research Center, Yorktown Heights. New York (United States)

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Description

We are in the process of developing and commissioning a scanning photoelectron microscope (SPEM) at the X1A beamline of the National Synchrotron Light Source (NSLS). It is designed to make use of the Soft X-ray Undulator (SXU) at the NSLS. This high brightness source illuminates a Fresnel zone plate, which forms a focused probe, {<=} 0.2{mu}m in size, on the specimen surface. A grating monochromator selects the photon energy in the 400-800 eV range with an energy resolution of better than 1 eV. The expected flux in the focus is in the 5 {times} 10{sup 7} {minus} 10{sup 9} photons/s range. A single pass Cylindrical Mirror Analyzer (CMA) is used to record photoemission spectra, or to form an image within a fixed electron energy bandwidth as the specimen is mechanically scanned. As a first test, a 1000 mesh Au grid was successfully imaged with a resolution of about 1{mu}m and the CMA tuned to the Au 4 f photoelectron peak. Once it is commissioned, a program is planned which will utilize the microscope to study beam sensitive systems, such as thin oxide/sub-oxide films of alumina and silica, and ultimately various adsorbates on these films. 14 refs., 4 figs.

Physical Description

11 pages

Notes

NTIS, PC A03/MF A01; OSTI; INIS; GPO Dep.

Source

  • 9. international conference on vacuum ultraviolet radiation physics, Honolulu, HI (USA), 14-18 Aug 1989

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  • Other: DE90001551
  • Report No.: BNL-43327
  • Report No.: CONF-890809--2
  • Grant Number: AC02-76CH00016
  • Office of Scientific & Technical Information Report Number: 5480483
  • Archival Resource Key: ark:/67531/metadc1086112

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Office of Scientific & Technical Information Technical Reports

Reports, articles and other documents harvested from the Office of Scientific and Technical Information.

Office of Scientific and Technical Information (OSTI) is the Department of Energy (DOE) office that collects, preserves, and disseminates DOE-sponsored research and development (R&D) results that are the outcomes of R&D projects or other funded activities at DOE labs and facilities nationwide and grantees at universities and other institutions.

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Creation Date

  • January 1, 1989

Added to The UNT Digital Library

  • Feb. 10, 2018, 10:06 p.m.

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  • Jan. 19, 2024, 7:48 p.m.

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Ade, Harald; Kirz, Janos; Hulbert, Steve; Johnson, Erik; Anderson, Erik & Kern, Dieter. A scanning photoelectron microscope (SPEM) at the National Synchrotron Light Source (NSLS), article, January 1, 1989; Upton, New York. (https://digital.library.unt.edu/ark:/67531/metadc1086112/: accessed April 19, 2024), University of North Texas Libraries, UNT Digital Library, https://digital.library.unt.edu; crediting UNT Libraries Government Documents Department.

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