Evaluation of unencapsulated ceramic monolithic and MOS thin-film capacitors (25 to 300/sup 0/C)

PDF Version Also Available for Download.

Description

Several commercial monolithic ceramic and thin-film MOS chip capacitors were evaluated for use in high temperature (300/sup 0/C) geothermal instrumentation. Characteristics of the commonly used dielectric materials (NPO, X7R, BX) and temperature dependence of the insulation resistance are briefly discussed. Some ceramic capacitors with NPO dielectric materials had insulation resistances above 10 megohms at 300/sup 0/C and less than 2% change in capacitance from 25/sup 0/C to 300/sup 0/C, while the X7R and BX dielectric materials exhibited insulation resistances below 10 megohm and changes in capacitance greater then 50%. The thin-film capacitors showed good stability at 300/sup 0/C. However, during ... continued below

Physical Description

Pages: 31

Creation Information

Nance, W.R. January 1, 1982.

Context

This report is part of the collection entitled: Office of Scientific & Technical Information Technical Reports and was provided by UNT Libraries Government Documents Department to Digital Library, a digital repository hosted by the UNT Libraries. More information about this report can be viewed below.

Who

People and organizations associated with either the creation of this report or its content.

Author

Publisher

Provided By

UNT Libraries Government Documents Department

Serving as both a federal and a state depository library, the UNT Libraries Government Documents Department maintains millions of items in a variety of formats. The department is a member of the FDLP Content Partnerships Program and an Affiliated Archive of the National Archives.

Contact Us

What

Descriptive information to help identify this report. Follow the links below to find similar items on the Digital Library.

Description

Several commercial monolithic ceramic and thin-film MOS chip capacitors were evaluated for use in high temperature (300/sup 0/C) geothermal instrumentation. Characteristics of the commonly used dielectric materials (NPO, X7R, BX) and temperature dependence of the insulation resistance are briefly discussed. Some ceramic capacitors with NPO dielectric materials had insulation resistances above 10 megohms at 300/sup 0/C and less than 2% change in capacitance from 25/sup 0/C to 300/sup 0/C, while the X7R and BX dielectric materials exhibited insulation resistances below 10 megohm and changes in capacitance greater then 50%. The thin-film capacitors showed good stability at 300/sup 0/C. However, during aging, bonds and bond pads presented a problem causing intermittently open circuits for some of the devices.

Physical Description

Pages: 31

Notes

NTIS, PC A02/MF A01.

Source

  • Other Information: Portions of document are illegible

Language

Item Type

Identifier

Unique identifying numbers for this report in the Digital Library or other systems.

  • Other: DE82014359
  • Report No.: SAND-82-0158
  • Grant Number: AC04-76DP00789
  • DOI: 10.2172/5217779 | External Link
  • Office of Scientific & Technical Information Report Number: 5217779
  • Archival Resource Key: ark:/67531/metadc1068564

Collections

This report is part of the following collection of related materials.

Office of Scientific & Technical Information Technical Reports

Reports, articles and other documents harvested from the Office of Scientific and Technical Information.

Office of Scientific and Technical Information (OSTI) is the Department of Energy (DOE) office that collects, preserves, and disseminates DOE-sponsored research and development (R&D) results that are the outcomes of R&D projects or other funded activities at DOE labs and facilities nationwide and grantees at universities and other institutions.

What responsibilities do I have when using this report?

When

Dates and time periods associated with this report.

Creation Date

  • January 1, 1982

Added to The UNT Digital Library

  • Feb. 4, 2018, 10:51 a.m.

Description Last Updated

  • March 20, 2018, 8:36 p.m.

Usage Statistics

When was this report last used?

Yesterday: 0
Past 30 days: 1
Total Uses: 1

Interact With This Report

Here are some suggestions for what to do next.

Start Reading

PDF Version Also Available for Download.

Citations, Rights, Re-Use

Nance, W.R. Evaluation of unencapsulated ceramic monolithic and MOS thin-film capacitors (25 to 300/sup 0/C), report, January 1, 1982; United States. (digital.library.unt.edu/ark:/67531/metadc1068564/: accessed April 22, 2018), University of North Texas Libraries, Digital Library, digital.library.unt.edu; crediting UNT Libraries Government Documents Department.