Interconnect fatigue design for terrestrial photovoltaic modules

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Fatigue of solar cell electrical interconnects due to thermal cycling has historically been a major failure mechanism in photovoltaic arrays; the results of a comprehensive investigation of interconnect fatigue that has led to the definition of useful reliability-design and life-prediction algorithms are presented. Experimental data gathered in this study indicate that the classical strain-cycle (fatigue) curve for the interconnect material is a good model of mean interconnect fatigue performance, but it fails to account for the broad statistical scatter, which is critical to reliability prediction. To fill this shortcoming the classical fatigue curve is combined with experimental cumulative interconnect failure ... continued below

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Pages: 53

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Mon, G. R.; Moore, D. M. & Ross, Jr., R. G. March 1, 1982.

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Description

Fatigue of solar cell electrical interconnects due to thermal cycling has historically been a major failure mechanism in photovoltaic arrays; the results of a comprehensive investigation of interconnect fatigue that has led to the definition of useful reliability-design and life-prediction algorithms are presented. Experimental data gathered in this study indicate that the classical strain-cycle (fatigue) curve for the interconnect material is a good model of mean interconnect fatigue performance, but it fails to account for the broad statistical scatter, which is critical to reliability prediction. To fill this shortcoming the classical fatigue curve is combined with experimental cumulative interconnect failure rate data to yield statistical fatigue curves (having failure probability as a parameter) which enable: (1) the prediction of cumulative interconnect failures during the design life of an array field; and (2) the unambiguous - i.e., quantitative - interpretation of data from field-service qualification (accelerated thermal cycling) tests. Optimal interconnect cost-reliability design algorithms are derived based on minimizing the cost of energy over the design life of the array field. This procedure yields not only the minimum break-even cost of delivered energy, but also the required degree of interconnect redundancy and an estimate of array power degradation during the design life of the array field. The usefulness of the design algorithms is demonstrated with realistic examples of design optimization, prediction, and service qualification testing.

Physical Description

Pages: 53

Notes

NTIS, PC A04/MF A01.

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  • Other: DE82013333
  • Report No.: DOE/JPL-1012-62
  • Grant Number: AI01-76ET20356
  • DOI: 10.2172/5251643 | External Link
  • Office of Scientific & Technical Information Report Number: 5251643
  • Archival Resource Key: ark:/67531/metadc1067148

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Office of Scientific & Technical Information Technical Reports

Reports, articles and other documents harvested from the Office of Scientific and Technical Information.

Office of Scientific and Technical Information (OSTI) is the Department of Energy (DOE) office that collects, preserves, and disseminates DOE-sponsored research and development (R&D) results that are the outcomes of R&D projects or other funded activities at DOE labs and facilities nationwide and grantees at universities and other institutions.

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  • March 1, 1982

Added to The UNT Digital Library

  • Feb. 4, 2018, 10:51 a.m.

Description Last Updated

  • March 23, 2018, 6:27 p.m.

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Mon, G. R.; Moore, D. M. & Ross, Jr., R. G. Interconnect fatigue design for terrestrial photovoltaic modules, report, March 1, 1982; United States. (digital.library.unt.edu/ark:/67531/metadc1067148/: accessed April 21, 2018), University of North Texas Libraries, Digital Library, digital.library.unt.edu; crediting UNT Libraries Government Documents Department.