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Submitted to: Nucl. Instr. Meth. A, Proc. SRI91 Conf. Synchr. Rad. (Baton Rouge, 1991)
X-ray intensity interferometer for undulator radiation
E. GLUSKIN, I. MCNULTY, and P.J. VICCARO
Advanced Photon Source
Argonne National Laboratory, Argonne, IL 60439, USA
The submitted manuscript has been authored
by a contractor of the U S Government
under contract No W-31-1Q9-ENG-38.
Accordingly, the U. 5. Government retains a
nonexclusive, royalty-tree license to publish
or reproduce the published lorm ol this
contribution, or allow others to do so, lor
U. S. Government purposes.
M. R. HOWELLS1,
Advanced Light Source
Lawrence Berkeley Laboratory, Berkeley, CA 94720, USA
ANL/CP—76025
DE92 015184
Abstract
Intensity interferometry is well established with visible light but has never been
demonstrated with x-radiation. We propose to measure the transverse
coherence of an x-ray beam, for the first time, using the method of Hanbury
Brown and Twiss. The x-ray interferometer consists of an array of slits, a grazing
incidence reflective beamsplitter, a pair of fast multichannel plate detectors and
a broadband, low-noise correlator circuit. The NSLS X1 or X13 soft x-ray
undulator will supply the partially coherent x-rays. We are developing this
technique to characterize the coherence properties of x-ray beams from high
brilliance insertion devices at third-generation synchrotron light facilities such
as the Advanced Photon Source and the Advanced Light Source.
1. Introduction
Hanbury Brown and Twiss (HBT) intensity interferometry was first applied
optically to measurement of the angular sizes of stars [1]. It is potentially suited
to characterization of the coherence properties of x-ray beams produced by
high brilliance undulators [2-4]. The vertical phase space of undulator emission
approaches the diffraction limit at modern low-emittance storage rings,
therefore, determination of the source extent and shape is of considerable
interest for both x-ray and electron beam diagnostics, and for coherence-
dependent applications such as x-ray microfocusing [5] and holography [6].
Currently at the European Synchrotron Radiation Facility, BP220, 38043 Grenoble, France.
distribution or this document is unlimited
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Gluskin, E.; McNulty, I.; Viccaro, P.J. (Argonne National Lab., IL (United States)) & Howells, M.R. (Lawrence Berkeley Lab., CA (United States)). X-ray intensity interferometer for undulator radiation, article, January 1, 1991; Illinois. (https://digital.library.unt.edu/ark:/67531/metadc1065070/m1/1/: accessed April 17, 2024), University of North Texas Libraries, UNT Digital Library, https://digital.library.unt.edu; crediting UNT Libraries Government Documents Department.