X-ray intensity interferometer for undulator radiation

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Intensity interferometry is well established with visible light but has never been demonstrated with x-radiation. We propose to measure the transverse coherence of an x-ray beam, for the first time, using the method of Hanbury Brown and Twiss. The x-ray interferometer consists of an array of slits, a grazing incidence reflective beamsplitter, a pair of fast multichannel plate detectors and a broadband, low-noise correlator circuit. The NSLS X1 or X13 soft x-ray undulator will supply the partially coherent x-rays. We are developing this technique to characterize the coherence properties of x-ray beams from high brilliance insertion devices at third-generation synchrotron ... continued below

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Pages: (14 p)

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Gluskin, E.; McNulty, I.; Viccaro, P.J. (Argonne National Lab., IL (United States)) & Howells, M.R. (Lawrence Berkeley Lab., CA (United States)) January 1, 1991.

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Intensity interferometry is well established with visible light but has never been demonstrated with x-radiation. We propose to measure the transverse coherence of an x-ray beam, for the first time, using the method of Hanbury Brown and Twiss. The x-ray interferometer consists of an array of slits, a grazing incidence reflective beamsplitter, a pair of fast multichannel plate detectors and a broadband, low-noise correlator circuit. The NSLS X1 or X13 soft x-ray undulator will supply the partially coherent x-rays. We are developing this technique to characterize the coherence properties of x-ray beams from high brilliance insertion devices at third-generation synchrotron light facilities such as the Advanced Photon Source and the Advanced Light Source. 17 refs.

Physical Description

Pages: (14 p)

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OSTI; NTIS; INIS; GPO Dep.

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  • 7. national conference and exhibition on synchrotron radiation instrumentation, Baton Rouge, LA (United States), 28-31 Oct 1991

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  • Other: DE92015184
  • Report No.: ANL/CP-76025
  • Report No.: CONF-9110146--19
  • Grant Number: W-31109-ENG-38
  • Grant Number: AC03-76SF00098
  • Office of Scientific & Technical Information Report Number: 5255683
  • Archival Resource Key: ark:/67531/metadc1065070

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  • January 1, 1991

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  • Feb. 4, 2018, 10:51 a.m.

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  • April 17, 2018, 3:40 p.m.

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Gluskin, E.; McNulty, I.; Viccaro, P.J. (Argonne National Lab., IL (United States)) & Howells, M.R. (Lawrence Berkeley Lab., CA (United States)). X-ray intensity interferometer for undulator radiation, article, January 1, 1991; Illinois. (digital.library.unt.edu/ark:/67531/metadc1065070/: accessed May 20, 2018), University of North Texas Libraries, Digital Library, digital.library.unt.edu; crediting UNT Libraries Government Documents Department.