Angle-resolved photoemission extended fine structure

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Core level angle-resolved photoemission intensity oscillates sinusoidally with increasing photoelectron momentum. Interference between direct and scattered photo-emission causes this angle-resolved photoemission extended fine structure (ARPEFS). We will discuss an analytic single-scattering theory which quantitatively describes the oscillations. The procedures for extracting surface geometry information from photoemission measurements will be illustrated with S(1s) ARPEFS from S on Ni(100) and Cu(100) obtained with the soft X-ray double crystal monochromator at the Stanford Synchrotron Radiation Laboratory. Building on the surface sensitivity and chemical selectivity of photoemission, ARPEFS analysis provides direct geometrical information from the oscillation frequencies (derived with auto-regressive Fourier analysis), from intensity ... continued below

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Pages: 9

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Barton, J.J.; Bahr, C.C.; Hussain, Z.; Robey, S.W.; Klebanoff, L.E. & Shirley, D.A. September 1, 1983.

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Core level angle-resolved photoemission intensity oscillates sinusoidally with increasing photoelectron momentum. Interference between direct and scattered photo-emission causes this angle-resolved photoemission extended fine structure (ARPEFS). We will discuss an analytic single-scattering theory which quantitatively describes the oscillations. The procedures for extracting surface geometry information from photoemission measurements will be illustrated with S(1s) ARPEFS from S on Ni(100) and Cu(100) obtained with the soft X-ray double crystal monochromator at the Stanford Synchrotron Radiation Laboratory. Building on the surface sensitivity and chemical selectivity of photoemission, ARPEFS analysis provides direct geometrical information from the oscillation frequencies (derived with auto-regressive Fourier analysis), from intensity changes with polarization and analyzer position, and from analysis of scattering phase-shift zero-crossings.

Physical Description

Pages: 9

Notes

NTIS, PC A02/MF A01.

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  • Advances in soft x-ray science and technology conference, Upton, NY, USA, 17 Oct 1983

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  • Other: DE84002899
  • Report No.: LBL-16298
  • Report No.: CONF-8310172-8
  • Grant Number: AC03-76SF00098
  • Office of Scientific & Technical Information Report Number: 5426049
  • Archival Resource Key: ark:/67531/metadc1064263

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  • September 1, 1983

Added to The UNT Digital Library

  • Feb. 4, 2018, 10:51 a.m.

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  • April 24, 2018, 5:46 p.m.

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Barton, J.J.; Bahr, C.C.; Hussain, Z.; Robey, S.W.; Klebanoff, L.E. & Shirley, D.A. Angle-resolved photoemission extended fine structure, article, September 1, 1983; [Berkeley,] California. (digital.library.unt.edu/ark:/67531/metadc1064263/: accessed November 17, 2018), University of North Texas Libraries, Digital Library, digital.library.unt.edu; crediting UNT Libraries Government Documents Department.