Synchrotron radiation as a source for quantitative XPS: advantages and consequences

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Synchrotron radiation (SR) has a variety of properties which make it an attractive source for quantitative x-ray photoelectron spectroscopy (XPS). Among the most significant are high intensity and tunability. In addition, the intensity of the dispersed radiation is comparable to laboratory line sources. Synchrotron radiation is also a clean source, i.e., it will not contaminate the sample, because it operates under ultra-high vacuum conditions. We have used these properties to demonstrate the advantages of SR as a source for quantitative XPS. We have also found several consequences associated with this source which can either limit its use or provide unique ... continued below

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Pages: 6

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Rosseel, T.M.; Carlson, T.A.; Negri, R.E.; Beall, C.E. & Taylor, J.W. January 1, 1986.

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Description

Synchrotron radiation (SR) has a variety of properties which make it an attractive source for quantitative x-ray photoelectron spectroscopy (XPS). Among the most significant are high intensity and tunability. In addition, the intensity of the dispersed radiation is comparable to laboratory line sources. Synchrotron radiation is also a clean source, i.e., it will not contaminate the sample, because it operates under ultra-high vacuum conditions. We have used these properties to demonstrate the advantages of SR as a source for quantitative XPS. We have also found several consequences associated with this source which can either limit its use or provide unique opportunities for analysis and research. Using the tunability of SR, we have measured the energy dependence of the 3p photoionization cross sections of Ti, Cr, and Mn from 50 to 150 eV above threshold at the University of Wisconsin's Tantalus electron-storage ring.

Physical Description

Pages: 6

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NTIS, PC A02/MF A01.

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  • 10. international vacuum congress and 6. international conference on solid surfaces and the 33. national symposium of the American Vacuum Society, Baltimore, MD, USA, 27 Oct 1986

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  • Other: DE87000389
  • Report No.: CONF-861019-4
  • Grant Number: AC05-84OR21400
  • Office of Scientific & Technical Information Report Number: 5037705
  • Archival Resource Key: ark:/67531/metadc1061228

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  • January 1, 1986

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  • Jan. 22, 2018, 7:23 a.m.

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  • Feb. 1, 2018, 6:31 p.m.

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Rosseel, T.M.; Carlson, T.A.; Negri, R.E.; Beall, C.E. & Taylor, J.W. Synchrotron radiation as a source for quantitative XPS: advantages and consequences, article, January 1, 1986; Tennessee. (digital.library.unt.edu/ark:/67531/metadc1061228/: accessed June 24, 2018), University of North Texas Libraries, Digital Library, digital.library.unt.edu; crediting UNT Libraries Government Documents Department.