TRANSIENT RADIATION EFFECTS IN CAPACITORS AND DIELECTRIC MATERIALS

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Measurements of dielectric leakage, capacitance, electric strength, andd charge scattering phenomena were performed at the Kukla and Godiva III critical assemblies for tantalum and aluminum electrolytic, wax- and oilimpregnated paper, mylar, mica, and ceramic capacitors, and for mylar and Vitamin B-impregnated paper. Leakage data indicate that gamma induced conductivity in capacitor dielectric varies directly with gamma DELTA , where gamma is the gamma radiation rate and DELTA is 0.9 for mylar, 0.7 for Vitamin Q-impregnated paper, and approximately 1.0 for the other dielectrics. A small portion of the tantalum oxide conductivity induced by gamma radiation exhibited a recovery time of … continued below

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16 pages

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Wicklein, H. W. & Dickhaut, R. H. August 15, 1961.

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Measurements of dielectric leakage, capacitance, electric strength, andd charge scattering phenomena were performed at the Kukla and Godiva III critical assemblies for tantalum and aluminum electrolytic, wax- and oilimpregnated paper, mylar, mica, and ceramic capacitors, and for mylar and Vitamin B-impregnated paper. Leakage data indicate that gamma induced conductivity in capacitor dielectric varies directly with gamma DELTA , where gamma is the gamma radiation rate and DELTA is 0.9 for mylar, 0.7 for Vitamin Q-impregnated paper, and approximately 1.0 for the other dielectrics. A small portion of the tantalum oxide conductivity induced by gamma radiation exhibited a recovery time of approximately 150 mu s. Transient capacitance changes due to radiation were non- existent within plus or minus 0.1% for mica and Vitamin Q capacitors. Transient charging of tantalum capacitors was noted during irradiation with no applied voltage. No drastic changes in electric strength were noted during irradiation of mylar and Vitamin Q-impregnated paper. Results are compared with a summary of data previously collected by others. The use of test data in parametric form as a tool for predicting transient radiation effects is discussed. (auth)

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16 pages

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  • Report No.: CONF-299-1
  • Report No.: D2-90173
  • Office of Scientific & Technical Information Report Number: 4877879
  • Archival Resource Key: ark:/67531/metadc1056189

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Office of Scientific & Technical Information Technical Reports

Reports, articles and other documents harvested from the Office of Scientific and Technical Information.

Office of Scientific and Technical Information (OSTI) is the Department of Energy (DOE) office that collects, preserves, and disseminates DOE-sponsored research and development (R&D) results that are the outcomes of R&D projects or other funded activities at DOE labs and facilities nationwide and grantees at universities and other institutions.

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  • August 15, 1961

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  • Jan. 22, 2018, 7:23 a.m.

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  • July 12, 2019, 2:25 p.m.

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Wicklein, H. W. & Dickhaut, R. H. TRANSIENT RADIATION EFFECTS IN CAPACITORS AND DIELECTRIC MATERIALS, book, August 15, 1961; United States. (https://digital.library.unt.edu/ark:/67531/metadc1056189/: accessed January 17, 2026), University of North Texas Libraries, UNT Digital Library, https://digital.library.unt.edu; crediting UNT Libraries Government Documents Department.

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