Diagnosis of Malfunctions in Complex Electronic Assemblies. Final Report. Page: 65 of 66
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Ideal diagnostic procedure would require:
" That the unit be diagnosed at the time of failure before removal from the
* That the diagnostician be allowed to remove stamps and proceed with a
planned and careful disassembly of the unit when it is necessary to assure
This approach has the disadvantages of:
" Operator error in removing stamps;
" Less efficient disassembly; and
" Less skillful disassembly. unless disassembly is done by a skilled
assembler under the supervision of the diagnostician.
The possibility of inspection stamps being in the form of a seal that would be
broken automatically by disassembly was evaluated, and no universal type of
stamp that would conform to the many different unit configurations was found.
Further study would be required to prove this concept feasible. The rel.iabil-
ity gains from rigid controls that ensure that no oversight is made in stamp
removal and that disassembly is performed by personnel trained for that work
must be weighed against the effects that discontinuities have upon diagnostic
results. However, the detailed study required to establish new product
stamping specifications was beyond the intended scope of this project.
A faultfinding system congruent with the project objectives was developed.
The system employs highly-trained technicians who are supported by engi-
neering troubleshooting information, a technical manual of instructions, and
both specially-designed and commercially-available diagnostic equipment to
fill every troubleshooting need. Training programs and grading systems
were established along the guidelines stipulated by the development order.
Production troubleshooting guides designed from the prototype manuals
developed during this program are now in scheduled production use and have
proved effective in transferring and translating technical information and
troubleshooting instructions to the production operators. Both Bendix and
Design Agency engineering-support technicians use these manuals as tech-
Isolation of fabrication errors and component failures with the in-process
testers proved feasible. The development tester used to study the basic
concepts was converted to regular production use, and has simplified some
diagnostic problems significantly.
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Losure, J. A. Diagnosis of Malfunctions in Complex Electronic Assemblies. Final Report., report, January 1, 1971; Kansas City, Missouri. (https://digital.library.unt.edu/ark:/67531/metadc1031893/m1/65/: accessed March 23, 2019), University of North Texas Libraries, Digital Library, https://digital.library.unt.edu; crediting UNT Libraries Government Documents Department.