Diagnosis of Malfunctions in Complex Electronic Assemblies. Final Report. Page: 55 of 66
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Inspection reports and on-the-job observations revealed that probes used on
scopes, voltmeters, and other diagnostic instruments were sometimes large
enough to cause accidental short circuits during probing.
Developing a Laboratory. From data collected from the study, a system
was defined to increase the diagnostic capability of the troubleshooter and
to allow component verification, with the exception of integrated and hybrid
components. The concept proposes a troubleshooting laboratory conveniently
located so that the operators, by use of special carts, could transport port-
able equipment from the lab to the production line or bring the units to the
The list of recommended laboratory equipment included those diagnostic
testers previously outlined in Phase 2 and those listed below:
" A curve tracer for semiconductor evaluation;
" A portable transistor checker;
" A logic generator, Figure 10;
" Any specially designed diagnostic equipment falling in the various cate-
gories of this report;
" ANRLC bridge;
" Two digital multicheckers with minimum 10 megohm input resistances
and minimal reactances;
" A dual-beam oscilloscope;
" A small, portable frequency-counter/time-interval meter;
" Accessories such as special hookup devices, clip leads, and probes; and
" An ohmeter with open-circuit voltage and short-circuit current limited to
assure no damage to semiconductor functions.
Equipment that would analyze integrated circuits and hybrid circuits was not
recommended. Although open-setup test methods are economically feasible,
welded or sealed construction in many assemblies prevents ready access for
conventional test probes. When such assemblies are opened for testing,
they normally cannot be reused. In addition, evaluation of such a unit is
more complex than evaluation of individual components. For example, a
capacitor can be evaluated by simply lifting one end of the capacitor, but
a sealed hybrid pack containing many components may require specially-
designed equipment. When troubleshooting this type of circuitry, emphasis
must be kept on diagnosis with the pack on the board.
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Losure, J. A. Diagnosis of Malfunctions in Complex Electronic Assemblies. Final Report., report, January 1, 1971; Kansas City, Missouri. (https://digital.library.unt.edu/ark:/67531/metadc1031893/m1/55/: accessed March 25, 2019), University of North Texas Libraries, Digital Library, https://digital.library.unt.edu; crediting UNT Libraries Government Documents Department.