Diagnosis of Malfunctions in Complex Electronic Assemblies. Final Report. Page: 37 of 66
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spring contacts into the unit under test. The mounting dimensions and mating
connections are completely independent of operator adjustments. Factors such
as tilt and distortion from irregular pressures are automatically controlled.
A schematic diagram of the tester is shown in Figure 5.
Detector Design. The two detectors in the tester were designed for the
" To check logic gates by running them through a truth table or by simu-
lating actual operation in the circuit, depending on the stage of fabrication
" To check the pulse widths of monostable and other types of multivibrator
" To check resistors, diodes, inductors, and capacitors by testing the
individual components with no power applied to the board.
Functional Detector Operation. The circuitry on the printed wiring board
consists of logic gates, one-shots, flip-flops, and various other typical logic
switches. The schematic sketch below is representative of the type. of
circuitry on the board.
The detector examines the input and output pulses of each stage for proper
amplitude and pulse width, and indicates the failures. For example: assume
that the production operation places the printed circuit board on the tester,
switches a rotating selector to position-1, and gets an accept indication; but
when the test switch is advanced to position-2, a rejection is indicated. The
The operator is referred to a visual aid which is a pictorial view of the unit
where components C1, R1, and P1 are clearly identified. The assembler
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Losure, J. A. Diagnosis of Malfunctions in Complex Electronic Assemblies. Final Report., report, January 1, 1971; Kansas City, Missouri. (https://digital.library.unt.edu/ark:/67531/metadc1031893/m1/37/: accessed March 21, 2019), University of North Texas Libraries, Digital Library, https://digital.library.unt.edu; crediting UNT Libraries Government Documents Department.