Diagnosis of Malfunctions in Complex Electronic Assemblies. Final Report. Page: 32 of 66
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deviation from the norm. The waveform and static parameters of internal
circuitry have equal significance with the output circuitry condition from a
diagnostic viewpoint. Troubleshooting tester design should consider accessi-
bility to internal circuit nodes and methods for evaluating individual stages
of the circuitry.
The present- method of determining the necessary test equipment for incoming
schedules is based on the summation of inspection time, troubleshooting
time, and tester down-time estimates. These are derived from projected
reject rate, task rates and time studies, and schedule information. In those
cases where the troubleshooting time estimates indicates the need for an
additional tester, a troubleshooting tester should be considered an alternative
to buying another inspection tester because economic benefits can be realized
by the reduction in initial cost of equipment and more efficient troubleshooting.
Additional benefits can be realized where particular diagnostic problems are
affecting schedules or interrupting normal product flow.
Concept Number 3. This tester concept included portable equipment that.
would supplement the inspection testers. The concept- includes diagnostic
equipment to evaluate components, special-design testers that adapt to the
inspection tester to extend its diagnostic capabilities, special probes, simu-
lated loads, and other similar types.
Concept Number 4. A type of tester that simulates product circuitry was
selected for development. - This concept assumed the following features.
* The tester circuitry simulates the circuitry in an electronic subassembly
so faults can'be self-imposed into the circuitry and the results of the
faults can be observed..
" The tester is to serve as a training unit and a diagnostic aid.
" The tester provides overload protection against accidental shorts, and
extreme-value substitution will not damage the tester.
Development of Tester Concept Number 1.
Feasibility Studies. Before starting the tester design efforts, the following
areas were evaluated to set. design criteria and to outline a detail develop-
i The various types of circuitry that the tester must test;
i A universal tester versus small individual testers; .
* Selection of a typical piece of circuitry to use in the experiment; and
S Outlining the plan to prove the concept feasible.
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Losure, J. A. Diagnosis of Malfunctions in Complex Electronic Assemblies. Final Report., report, January 1, 1971; Kansas City, Missouri. (https://digital.library.unt.edu/ark:/67531/metadc1031893/m1/32/: accessed March 22, 2019), University of North Texas Libraries, Digital Library, https://digital.library.unt.edu; crediting UNT Libraries Government Documents Department.