Spectroscopy of nuclear systems. Progress report, January 1--December 31, 1974 Page: 49 of 53
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2. Silicon x-ray escape peak correction
If the x rays emitted by the silicon atoms in the Si(LU) crystal
escape from the crystal, the energy deposited in the detector will be
Er - E - E(B) (1)
Mere, E is the energy of the incoming x ray. E' is the energy deposited
in the crystal, and E(B) is the binding energy of silicon, 1.74 keV.
A correction for the presence of a silicon x-ray escape peak under
a lower energy photopeak will be necessary when
E - (1.74 f M) keV (2)
where E is the energy difference between two x rays and FFT H is the full
width at tenth maximum of the Si(LI) detector at energy Ex.
The silicon x-ray escape peak efficiency was determined by measuring
the ratio of counts in the escape peak relative to the number of counts in
the photopeak detected in the Si(Li) crystal for the low energy photons
(<14 keV) from 57Co and 54Mn sources. These data were then fit to a curve
dervied from Axel's formula29 for the x-ray escape peak probability of a
similar dimensioned Si(LI) detector.30
G. New Lithium Drifted Germanium Detector
A new 11.7% true coaxial Ge(Li) detector was purchased during the past
year. This detector has an energy resolution of <2.2 keV at 1332 keV.
29. P. Axel, BNL 271 (T-44) (1953).
30. R.E. Wood, P. Venugopala Rao, 0.H. Puckett and J.M. Palms, Nucl. Inst.
and Methods 94, 245 (1971).
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Macias, E. S. Spectroscopy of nuclear systems. Progress report, January 1--December 31, 1974, report, January 1, 1974; St. Louis, Missouri. (https://digital.library.unt.edu/ark:/67531/metadc1020885/m1/49/: accessed April 26, 2019), University of North Texas Libraries, Digital Library, https://digital.library.unt.edu; crediting UNT Libraries Government Documents Department.