Quantification of thin film crystallographic orientation using X-ray diffraction with an area detector

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As thin films become increasingly popular (for solar cells, LEDs, microelectronics, batteries), quantitative morphological information is needed to predict and optimize the film's electronic, optical and mechanical properties. This quantification can be obtained quickly and easily with X-ray diffraction using an area detector and synchrotron radiation in two simple geometries. In this paper, we describe a methodology for constructing complete pole figures for thin films with fiber texture (isotropic in-plane orientation). We demonstrate this technique on semicrystalline polymer films, self-assembled nanoparticle semiconductor films, and randomly-packed metallic nanoparticle films. This method can be immediately implemented to help understand the relationship between ... continued below

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Baker, Jessica L; Jimison, Leslie H; Mannsfeld, Stefan; Volkman, Steven; Yin, Shong; Subramanian, Vivek et al. February 19, 2010.

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As thin films become increasingly popular (for solar cells, LEDs, microelectronics, batteries), quantitative morphological information is needed to predict and optimize the film's electronic, optical and mechanical properties. This quantification can be obtained quickly and easily with X-ray diffraction using an area detector and synchrotron radiation in two simple geometries. In this paper, we describe a methodology for constructing complete pole figures for thin films with fiber texture (isotropic in-plane orientation). We demonstrate this technique on semicrystalline polymer films, self-assembled nanoparticle semiconductor films, and randomly-packed metallic nanoparticle films. This method can be immediately implemented to help understand the relationship between film processing and microstructure, enabling the development of better and less expensive electronic and optoelectronic devices.

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  • Journal Name: Langmuir

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  • Report No.: LBNL-3865E
  • Grant Number: DE-AC02-05CH11231
  • DOI: 10.1021/la904840q | External Link
  • Office of Scientific & Technical Information Report Number: 986871
  • Archival Resource Key: ark:/67531/metadc1014415

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  • February 19, 2010

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  • Oct. 14, 2017, 8:36 a.m.

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  • Oct. 18, 2017, 10:37 a.m.

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Baker, Jessica L; Jimison, Leslie H; Mannsfeld, Stefan; Volkman, Steven; Yin, Shong; Subramanian, Vivek et al. Quantification of thin film crystallographic orientation using X-ray diffraction with an area detector, article, February 19, 2010; Berkeley, California. (digital.library.unt.edu/ark:/67531/metadc1014415/: accessed September 22, 2018), University of North Texas Libraries, Digital Library, digital.library.unt.edu; crediting UNT Libraries Government Documents Department.