Improved Spatial Resolution for Reflection Mode Infrared Microscopy

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Standard commercial infrared microscopes operating in reflection mode use a mirror to direct the reflected light from the sample to the detector. This mirror blocks about half of the incident light, however, and thus degrades the spatial resolution by reducing the umerical aperture of the objective. Here, we replace the mirror with a 50% beamsplitter to allow full illumination of the objective and retain a way to direct the reflected light to the detector. The improved spatial resolution is demonstrated using two different microscopes apable of diffraction-limited resolution: the first microscope is coupled to a synchrotron source and utilizes a ... continued below

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Bechtel, Hans A.; Martin, Michael C.; May, T.E. & Lerch, Philippe October 9, 2009.

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Standard commercial infrared microscopes operating in reflection mode use a mirror to direct the reflected light from the sample to the detector. This mirror blocks about half of the incident light, however, and thus degrades the spatial resolution by reducing the umerical aperture of the objective. Here, we replace the mirror with a 50% beamsplitter to allow full illumination of the objective and retain a way to direct the reflected light to the detector. The improved spatial resolution is demonstrated using two different microscopes apable of diffraction-limited resolution: the first microscope is coupled to a synchrotron source and utilizes a single point detector, whereas the second microscope has a standard blackbody source and uses a focal planetarray (FPA) detector.

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  • Journal Name: Review of Scientific Instruments; Journal Volume: 80

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  • Report No.: LBNL-3007E
  • Grant Number: DE-AC02-05CH11231
  • DOI: 10.1063/1.3270260 | External Link
  • Office of Scientific & Technical Information Report Number: 981520
  • Archival Resource Key: ark:/67531/metadc1014069

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Office of Scientific & Technical Information Technical Reports

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  • October 9, 2009

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  • Oct. 14, 2017, 8:36 a.m.

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  • Oct. 17, 2017, 6:21 p.m.

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Bechtel, Hans A.; Martin, Michael C.; May, T.E. & Lerch, Philippe. Improved Spatial Resolution for Reflection Mode Infrared Microscopy, article, October 9, 2009; Berkeley, California. (digital.library.unt.edu/ark:/67531/metadc1014069/: accessed December 15, 2017), University of North Texas Libraries, Digital Library, digital.library.unt.edu; crediting UNT Libraries Government Documents Department.