Charge Collection Studies on Integrated Circuit Test Structures using Heavy-Ion Microbeams and MEDICI Simulation Calculations

Charge Collection Studies on Integrated Circuit Test Structures using Heavy-Ion Microbeams and MEDICI Simulation Calculations

Date: May 2000
Creator: Guo, Baonian
Description: Ion induced charge collection dynamics within Integrated Circuits (ICs) is important due to the presence of ionizing radiation in the IC environment. As the charge signals defining data states are reduced by voltage and area scaling, the semiconductor device will naturally have a higher susceptibility to ionizing radiation induced effects. The ionizing radiation can lead to the undesired generation and migration of charge within an IC. This can alter, for example, the memory state of a bit, and thereby produce what is called a "soft" error, or Single Event Upset (SEU). Therefore, the response of ICs to natural radiation is of great concern for the reliability of future devices. Immunity to soft errors is listed as a requirement in the 1997 National Technology Roadmap for Semiconductors prepared by the Semiconductor Industry Association in the United States. To design more robust devices, it is essential to create and test accurate models of induced charge collection and transport in semiconductor devices. A heavy ion microbeam produced by an accelerator is an ideal tool to study charge collection processes in ICs and to locate the weak nodes and structures for improvement through hardening design. In this dissertation, the Ion Beam Induced Charge Collection ...
Contributing Partner: UNT Libraries
Thermal annealing behavior of an oxide layer under silicon

Thermal annealing behavior of an oxide layer under silicon

Date: December 15, 1982
Creator: Hamdi, A. H.; McDaniel, Floyd Del. (Floyd Delbert), 1942-; Pinizzotto, Russell F.; Matteson, Samuel E.; Lam, H. W. & Malhi, S. D. S.
Description: This article discusses the thermal annealing behavior of an oxide layer under silicon.
Contributing Partner: UNT College of Arts and Sciences
Real-Time Systems: An Introduction and the State-of-the-Art

Real-Time Systems: An Introduction and the State-of-the-Art

Date: March 16, 2009
Creator: Kavi, Krishna M.; Akl, Robert G. & Hurson, Ali
Description: This encyclopedia article gives an overview of the broad area of real-time systems. This task is daunting because real-time systems are everywhere, and yet no generally accepted definition differentiates real-time systems from non-real-time systems.
Contributing Partner: UNT College of Engineering