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in subjects: "Electronic Circuits"

open access

New mechanism for upset of electronics.

For many decades, engineers and scientists have studied the effects of high power microwaves (HPM) on electronics. These studies usually focus on means of delivering energy to upset electronic equipment and ways to protect equipment from HPM. The motivation for these studies is to develop the knowledge necessary either to cause disruption or to protect electronics from disruption. Since electronic circuits must absorb sufficient energy to fail and the source used to deliver this energy is far a… more

Date: March 1, 2004

Creator: Loubriel, Guillermo Manuel; Molina, Luis Leroy; Salazar, Robert Austin; Patterson, Paull Edward & Bacon, Larry Donald

Item Type: Report

Partner: UNT Libraries Government Documents Department

open access

Predicting the reliability of electronic circuits.

Procedures to predict the reliability of electrical circuits are discussed. Three cases are introduced and discussed. In Case 1, an analyst predicts the probability of any failure in the intended relations between circuit inputs and circuit outputs. In Case 2, an analyst predicts the probability that specified unintended outputs would occur. In Case 3, an analyst considers coupling between circuits. Logic models are given for the three cases, and sources of failure probabilities of components a… more

Date: June 1, 2004

Creator: Loescher, Douglas H.