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Intertrimer and Intratrimer Metallophilic and Excimeric Bonding in the Ground and Phosphorescent States of Trinuclear Coinage Metal Pyrazolates: A Computational Study

Intertrimer and Intratrimer Metallophilic and Excimeric Bonding in the Ground and Phosphorescent States of Trinuclear Coinage Metal Pyrazolates: A Computational Study

Date: April 8, 2006
Creator: Grimes, Thomas V.; Omary, Mohammad A.; Dias, H. V. Rasika & Cundari, Thomas R., 1964-
Description: This article discusses intertrimer and intratrimer metallophilic and excimeric bonding.
Contributing Partner: UNT College of Arts and Sciences
Ion Beam Analyses of Carbon Nanotubes

Ion Beam Analyses of Carbon Nanotubes

Date: January 7, 2005
Creator: Naab, Fabian U.; Holland, Orin W.; Duggan, Jerome L. & McDaniel, Floyd Del. (Floyd Delbert), 1942-
Description: This article discusses ion beam analyses of carbon nanotubes.
Contributing Partner: UNT College of Arts and Sciences
Introducing a Policy Turn in Environmental Philosophy

Introducing a Policy Turn in Environmental Philosophy

Date: 2006
Creator: Briggle, Adam; Frodeman, Robert & Holbrook, J. Britt
Description: This article discusses policies in environmental philosophy.
Contributing Partner: UNT College of Arts and Sciences
K-shell x-ray production cross sections of selected elements from Ti to Y for 0.5- to 2.5-MeV alpha-particle bombardment

K-shell x-ray production cross sections of selected elements from Ti to Y for 0.5- to 2.5-MeV alpha-particle bombardment

Date: May 1975
Creator: McDaniel, Floyd Del. (Floyd Delbert), 1942-; Gray, Tom J. & Gardner, R. K.
Description: This article discusses K-shell x-ray production cross sections of Ti, V, Cr, Fe, Ni, Cu, Zn, Ga, As, Se, Rb, Sr, and Y for 0.5- to 2.5-MeV alpha particles.
Contributing Partner: UNT College of Arts and Sciences
K-shell x rays of selected elements from Nb through Gd for incident protons and alpha particles from 0.6 to 2.4 MeV

K-shell x rays of selected elements from Nb through Gd for incident protons and alpha particles from 0.6 to 2.4 MeV

Date: September 1977
Creator: Wilson, Scott R.; McDaniel, Floyd Del. (Floyd Delbert), 1942-; Rowe, J. R. & Duggan, Jerome L.
Description: This article discusses K-shell x-rays of selected elements from Nb through Gd for incident protons and alpha particles from 0.6 to 2.4 MeV.
Contributing Partner: UNT College of Arts and Sciences
Low-energy vibrations at the InSb(110) surface

Low-energy vibrations at the InSb(110) surface

Date: December 15, 1995
Creator: Buongiorno Nardelli, Marco; Cvetko, D.; De Renzi, V.; Floreano, L.; Morgante, A.; Peloi, M. et al.
Description: Article on low-energy vibrations at the InSb(110) surface along the ΓΥ direction.
Contributing Partner: UNT College of Arts and Sciences
M-shell x-ray production cross sections for 0.5-2.5-MeV Be+ ions incident upon selected elements from praseodymium to bismuth

M-shell x-ray production cross sections for 0.5-2.5-MeV Be+ ions incident upon selected elements from praseodymium to bismuth

Date: January 15, 1988
Creator: Price, J. L.; Duggan, Jerome L.; McDaniel, Floyd Del. (Floyd Delbert), 1942-; Lapicki, Gregory & Mehta, R.
Description: This article discusses M-shell x-ray production cross sections for 0.5-2.5-MeV Be+ ions incident upon selected elements from praseodymium to bismuth.
Contributing Partner: UNT College of Arts and Sciences
Long-range surface plasmons in dielectric-metal-dielectric structure with highly anisotropic substrates

Long-range surface plasmons in dielectric-metal-dielectric structure with highly anisotropic substrates

Date: February 22, 2010
Creator: Nagaraj & Krokhin, Arkadii A.
Description: This article discusses long-range surface plasmons in dielectric-metal-dielectric structure with highly anisotropic substrates.
Contributing Partner: UNT College of Arts and Sciences
Low-level copper concentration measurements in silicon wafers using trace-element accelerator mass spectrometry

Low-level copper concentration measurements in silicon wafers using trace-element accelerator mass spectrometry

Date: June 8, 1998
Creator: McDaniel, Floyd Del. (Floyd Delbert), 1942-; Datar, Sameer A.; Guo, Baonian N.; Renfrow, Steve N.; Anthony, J. M. & Zhao, Z. Y.
Description: This article discusses low-level copper concentration measurements in silicon wafers using trace-element accelerator mass spectrometry.
Contributing Partner: UNT College of Arts and Sciences
Low-frequency index of refraction for a two-dimensional metallodielectric photonic crystal

Low-frequency index of refraction for a two-dimensional metallodielectric photonic crystal

Date: January 29, 2007
Creator: Krokhin, Arkadii A.; Reyes, E. & Gumen, L.
Description: This article discusses the low-frequency index of refraction for a two-dimensional metallodialectric photonic crystal.
Contributing Partner: UNT College of Arts and Sciences