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open access

Wafer Fabrication Monitoring/Control System and Method

Description: Patent relating to systems and methods for monitoring and testing patterning processes including etching, cleaning, and depositing of low k and ultra-low k dielectrics for semiconductor technologies.
Date: June 14, 2016
Creator: Chen, Jin-Jian & Chyan, Oliver M. R.
open access

Method of Enhancing Quality Factors in Cotton

Description: Patent relating to a method of enhancing quality factors in cotton.
Date: January 17, 2012
Creator: Hake, Kater Davis; Chapman, Kent D.; Kerby, Thomas Arthur & Speed, Thomas Rainey
open access

Graphene Magnetic Tunnel Junction Spin Filters and Methods of Making

Description: Patent relating to methods of forming a few molecule thick graphene layer on a ferromagnetic layer, at temperatures and conditions consistent with integration with silicon-based complementary metal oxide semiconductors (Si CMOS).
Date: February 7, 2017
Creator: Kelber, Jeffry A. & Zhou, Mi
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