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Formation and characterization of ion beam assisted nanosystems in silicon

Formation and characterization of ion beam assisted nanosystems in silicon

Date: August 2010
Creator: Poudel, Prakash R.; Rout, Bibhudutta; Hossain, K. M.; Dhoubhadel, Mangal; Kummari, Venkata C.; Neogi, Arup et al.
Description: Article on the formation and characterization of ion beam assisted nanosystems in silicon.
Contributing Partner: UNT College of Arts and Sciences
El Espejo, Volume 3, 2013

El Espejo, Volume 3, 2013

Date: January 2013
Creator: University of North Texas
Description: El Espejo literary journal contains writing by Spanish students at the University of North Texas including essays in Spanish literature and linguistics and creative pieces such as poetry and short stories.
Contributing Partner: UNT College of Arts and Sciences
An Elementary Characterization of the Orders of Non-Abelian Groups

An Elementary Characterization of the Orders of Non-Abelian Groups

Date: 2011
Creator: Anghel, Nicolae
Description: In this article, the author presents an elementary proof of a result due to Dickson characterizing those integers n admitting non-abelian groups of order n.
Contributing Partner: UNT College of Arts and Sciences
Caring for Yourself as a Caregiver

Caring for Yourself as a Caregiver

Date: February 28, 2013
Creator: Hayslip, Bert
Description: This presentation is part of the faculty lecture series UNT Speaks Out on Alzheimer's Disease and Dementia. In this presentation, Bert Hayslip, Regents Professor in the Department of Psychology, will discuss caregiving for Alzheimer's and dementia patients.
Contributing Partner: UNT College of Arts and Sciences
Ion Beam Analyses of Carbon Nanotubes

Ion Beam Analyses of Carbon Nanotubes

Date: January 7, 2005
Creator: Naab, Fabian U.; Holland, Orin W.; Duggan, Jerome L. & McDaniel, Floyd Del. (Floyd Delbert), 1942-
Description: This article discusses ion beam analyses of carbon nanotubes.
Contributing Partner: UNT College of Arts and Sciences
K-shell x rays of selected elements from Nb through Gd for incident protons and alpha particles from 0.6 to 2.4 MeV

K-shell x rays of selected elements from Nb through Gd for incident protons and alpha particles from 0.6 to 2.4 MeV

Date: September 1977
Creator: Wilson, Scott R.; McDaniel, Floyd Del. (Floyd Delbert), 1942-; Rowe, J. R. & Duggan, Jerome L.
Description: This article discusses K-shell x-rays of selected elements from Nb through Gd for incident protons and alpha particles from 0.6 to 2.4 MeV.
Contributing Partner: UNT College of Arts and Sciences
M-shell x-ray production cross sections for 0.5-2.5-MeV Be+ ions incident upon selected elements from praseodymium to bismuth

M-shell x-ray production cross sections for 0.5-2.5-MeV Be+ ions incident upon selected elements from praseodymium to bismuth

Date: January 15, 1988
Creator: Price, J. L.; Duggan, Jerome L.; McDaniel, Floyd Del. (Floyd Delbert), 1942-; Lapicki, Gregory & Mehta, R.
Description: This article discusses M-shell x-ray production cross sections for 0.5-2.5-MeV Be+ ions incident upon selected elements from praseodymium to bismuth.
Contributing Partner: UNT College of Arts and Sciences
Low-level copper concentration measurements in silicon wafers using trace-element accelerator mass spectrometry

Low-level copper concentration measurements in silicon wafers using trace-element accelerator mass spectrometry

Date: June 8, 1998
Creator: McDaniel, Floyd Del. (Floyd Delbert), 1942-; Datar, Sameer A.; Guo, Baonian N.; Renfrow, Steve N.; Anthony, J. M. & Zhao, Z. Y.
Description: This article discusses low-level copper concentration measurements in silicon wafers using trace-element accelerator mass spectrometry.
Contributing Partner: UNT College of Arts and Sciences
Nuclear lifetime of states in ⁹⁴Tc and ⁹⁶Tc via the pulsed-beam, direct-timing technique

Nuclear lifetime of states in ⁹⁴Tc and ⁹⁶Tc via the pulsed-beam, direct-timing technique

Date: September 1974
Creator: McDaniel, Floyd Del. (Floyd Delbert), 1942- & Snyder, F. D.
Description: This article discusses nuclear lifetime of states in ⁹⁴TC and ⁹⁶TC via the pulsed-beam, direct-timing technique.
Contributing Partner: UNT College of Arts and Sciences
Fast diffusion of As in polycrystalline silicon during rapid thermal annealing

Fast diffusion of As in polycrystalline silicon during rapid thermal annealing

Date: August 15, 1984
Creator: Wilson, Scott R.; Paulson, W. M.; Gregory, R. B.; Gressett, J. D.; Hamdi, A. H. & McDaniel, Floyd Del. (Floyd Delbert), 1942-
Description: This article discusses fast diffusion of As in polycrystalline silicon during rapid thermal annealing.
Contributing Partner: UNT College of Arts and Sciences