Date: May 1994
Creator: Kirchhoff, J. F.; Marble, D. K.; Weathers, Duncan L.; McDaniel, Floyd Del. (Floyd Delbert), 1942-; Matteson, Samuel E.; Anthony, J. M. et al.
Description: This article discusses an ultraclean accelerator mass spectronomy negative ion source for semiconductor material mass analysis that was built and is in operation at the University of North Texas' Ion Beam Modification and Analysis Laboratory (IBMAL).
Contributing Partner: UNT College of Arts and Sciences