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  Partner: UNT College of Arts and Sciences
 Department: Ion Beam Modification and Analysis Laboratory
 Resource Type: Article
Charge-state dependence of K-shell x-ray production in aluminum by 2-12-MeV carbon ions

Charge-state dependence of K-shell x-ray production in aluminum by 2-12-MeV carbon ions

Date: June 1996
Creator: Sun, H. L.; Yu, Y. C.; Lin, E. K.; Wang, C. W.; Duggan, Jerome L.; Azordegan, A. R. et al.
Description: Article discussing research on the charge-state dependence of K-shell x-ray production in aluminum by 2-12-MeV carbon ions.
Contributing Partner: UNT College of Arts and Sciences
Charge-state dependence of M-shell x-ray production in 67Ho by 2-12-MeV carbon ions

Charge-state dependence of M-shell x-ray production in 67Ho by 2-12-MeV carbon ions

Date: November 1995
Creator: Yu, Y. C.; Sun, H. L.; Duggan, Jerome L.; McDaniel, Floyd Del. (Floyd Delbert), 1942-; Yin, J. Y. & Lapicki, Gregory
Description: Article discussing research on the charge-state dependence of M-shell x-ray production in 67Ho by 2-12-MeV carbon ions.
Contributing Partner: UNT College of Arts and Sciences
Experimental evidence for a discrete transition to channeling for 1.0-MeV protons in Si〈100〉

Experimental evidence for a discrete transition to channeling for 1.0-MeV protons in Si〈100〉

Date: April 1998
Creator: Zhao, Z. Y.; Arrale, A. M.; Li, S. L.; Marble, D. K.; Weathers, Duncan L.; Matteson, Samuel E. et al.
Description: This article discusses experimental evidence for a discrete transition to channeling for 1.0-MeV protons in Si〈100〉.
Contributing Partner: UNT College of Arts and Sciences
Fabrication of silicon-based optical components for an ultraclean accelerator mass spectronomy negative ion source

Fabrication of silicon-based optical components for an ultraclean accelerator mass spectronomy negative ion source

Date: May 1994
Creator: Kirchhoff, J. F.; Marble, D. K.; Weathers, Duncan L.; McDaniel, Floyd Del. (Floyd Delbert), 1942-; Matteson, Samuel E.; Anthony, J. M. et al.
Description: Article discussing the fabrication of silicon-based optical components for an ultraclean accelerator mass spectonomy negative ion source.
Contributing Partner: UNT College of Arts and Sciences
Formation and characterization of ion beam assisted nanosystems in silicon

Formation and characterization of ion beam assisted nanosystems in silicon

Date: August 2010
Creator: Poudel, Prakash R.; Rout, Bibhudutta; Hossain, K. M.; Dhoubhadel, Mangal; Kummari, Venkata C.; Neogi, Arup et al.
Description: Article on the formation and characterization of ion beam assisted nanosystems in silicon.
Contributing Partner: UNT College of Arts and Sciences
High sensitivity measurement of implanted As in the presence of Ge in Ge(x)Si(1-x)/Si layered alloys using trace element accelerator mass spectrometry

High sensitivity measurement of implanted As in the presence of Ge in Ge(x)Si(1-x)/Si layered alloys using trace element accelerator mass spectrometry

Date: December 11, 2000
Creator: Datar, Sameer A.; Wu, Liying; Guo, Baonian N.; Nigam, Mohit; Necsoiu, Daniela; Zhai, Y. J. et al.
Description: This article discusses high sensitivity measurement of implanted As in the presence of Ge in Ge(x)Si(1-x)/Si layered alloys using trace element accelerator mass spectrometry.
Contributing Partner: UNT College of Arts and Sciences
Ion Beam Analyses of Carbon Nanotubes

Ion Beam Analyses of Carbon Nanotubes

Date: January 7, 2005
Creator: Naab, Fabian U.; Holland, Orin W.; Duggan, Jerome L. & McDaniel, Floyd Del. (Floyd Delbert), 1942-
Description: This article discusses ion beam analyses of carbon nanotubes.
Contributing Partner: UNT College of Arts and Sciences
Low-level copper concentration measurements in silicon wafers using trace-element accelerator mass spectrometry

Low-level copper concentration measurements in silicon wafers using trace-element accelerator mass spectrometry

Date: June 8, 1998
Creator: McDaniel, Floyd Del. (Floyd Delbert), 1942-; Datar, Sameer A.; Guo, Baonian N.; Renfrow, Steve N.; Anthony, J. M. & Zhao, Z. Y.
Description: This article discusses low-level copper concentration measurements in silicon wafers using trace-element accelerator mass spectrometry.
Contributing Partner: UNT College of Arts and Sciences
Simultaneous measurement of the average ion-induced electron emission yield and the mean charge for isotachic ions in carbon foils

Simultaneous measurement of the average ion-induced electron emission yield and the mean charge for isotachic ions in carbon foils

Date: February 1997
Creator: Arrale, A. M.; Zhao, Z. Y.; Kirchhoff, J. F.; Weathers, Duncan L.; McDaniel, Floyd Del. (Floyd Delbert), 1942- & Matteson, Samuel E.
Description: Article discussing the simultaneous measurement of the average ion-induced electron emission yield and the mean charge for isotachic ions in carbon foils.
Contributing Partner: UNT College of Arts and Sciences
Strain fields around high-energy ion tracks in α-quartz

Strain fields around high-energy ion tracks in α-quartz

Date: 2006
Creator: Follstaedt, David M.; Norman, A. K.; Doyle, B. L. & McDaniel, Floyd Del. (Floyd Delbert), 1942-
Description: This article discusses strain fields around high-energy ion tracks in α-quartz.
Contributing Partner: UNT College of Arts and Sciences
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