Description: Nanoindentation has become a widely used technique to measure the mechanical properties of materials. Due to its capability to deform materials in micro- and nano-scale, nanoindentation has found more applications in characterizing the deformation behavior and determining the mechanical properties of thin films and coatings. This research deals with the characterization of samples received from Center for Advanced Microstructures and Devices (CAMD) and Integran Technologies Inc., Toronto, Canada and the objective of this investigation was to utilize the experimental data obtained from nanoindentation to determine the deformation behavior, mechanical properties of thin films on substrates and bulk materials, and the effect of geometrically different indenters (Berkovich, cubecorner, and conical). X-ray diffraction (XRD), transmission electron microscope (TEM), scanning electron microscopy (SEM), and atomic force microscopy (AFM) analysis were performed on these materials to determine the crystal orientation, grain size of the material, and also to measure any substrate effects like pile-up or sin-in respectively. The results indicate that indentation size effect (ISE) strongly depends on shape of the indenter and less sensitive to penetration depth where as the hardness measurements depends on shape of indenter and depth of penetration. There is a negligible strain rate dependency of hardness at deeper depths ...

Description: Nanoindentation is a widely used technique to measure the mechanical properties of films with thickness ranging from nanometers to micrometers. A much better understanding of the contact mechanics is obtained mostly through finite element modeling. The experiments were modeled using the software package Nano SP1 that is based on COSMOSM™ (Structural Research & Analysis Corp, www.cosmosm.com), a finite element code. The fundamental material properties affecting pile-up are the ratio of the effective modulus to yield stress Eeff/σ and the work hardening behavior. Two separate cases of work hardening rates were considered; one with no work hardening rate and other with a linear work hardening rate. Specifically, it is observed that pile up is large only when hf/hmax is close to one and degree of work hardening rate is small. It should also be noted that when hf/hmax < 0.7 very little pile-up is observed no matter what the work-hardening behavior of the material. When pile-up occurs the contact area is greater than that predicted by the experimental methods and both the hardness and modulus are overestimated. In this report the amount by which these properties are overestimated are studied and got to be around 22% approx. Bluntness of the tip ...

Description: The purpose of this research was to determine which of the commonly used wireless telecommunication site concealment materials has the least effect on signal potency. The tested materials were Tuff Span® fiberglass panels manufactured by Enduro Composite Systems, Lexan® XL-1 polycarbonate plastic manufactured by GE Corporation and Styrofoam™ polystyrene board manufactured by The Dow Chemical Company. Testing was conducted in a double electrically isolated copper mesh screen room at the University of North Texas Engineering Technology Building in Denton, Texas. Analysis of the data found no differences exist between the radio frequency transmissiveness of these products at broadband personal communication service frequencies. However, differences in the signal do exist with regards to the angle of incidence between the material and the transmitting antenna.

Description: This thesis mainly aims at application of principles of engineering technology in the field of molecular beam epitaxy (MBE). MBE is a versatile technique for growing epitaxial thin films of semiconductors and metals by impinging molecular beams of atoms onto a heated substrate under ultra-high vacuum (UHV) conditions. Here, a LabVIEW® (laboratory virtual instrument engineering workbench) software (National Instruments Corp., http://www.ni.com/legal/termsofuse/unitedstates/usH) program is developed that would form the basis of a real-time control system that would transform MBE into a true-production technology. Growth conditions can be monitored in real-time with the help of reflection high energy electron diffraction (RHEED) technique. The period of one RHEED oscillation corresponds exactly to the growth of one monolayer of atoms of the semiconductor material. The PCI-1409 frame grabber card supplied by National Instruments is used in conjunction with the LabVIEW software to capture the RHEED images and capture the intensity of RHEED oscillations. The intensity values are written to a text file and plotted in the form of a graph. A fast Fourier transform of these oscillations gives the growth rate of the epi-wafer being grown. All the data being captured by the LabVIEW program can be saved to file forming a growth pedigree ...

Description: Indoor use of wireless systems poses one of the biggest design challenges. It is difficult to predict the propagation of a radio frequency wave in an indoor environment. To assist in deploying the above systems, characterization of the indoor radio propagation channel is essential. The contributions of this work are two-folds. First, in order to build a model, extensive field strength measurements are carried out inside two different buildings. Then, path loss exponents from log-distance path loss model and standard deviations from log-normal shadowing, which statistically describe the path loss models for a different transmitter receiver separations and scenarios, are determined. The purpose of this study is to characterize the indoor channel for 802.11 wireless local area networks at 2.4 GHz frequency. This thesis presents a channel model based on measurements conducted in commonly found scenarios in buildings. These scenarios include closed corridor, open corridor, classroom, and computer lab. Path loss equations are determined using log-distance path loss model and log-normal shadowing. The chi-square test statistic values for each access point are calculated to prove that the observed fading is a normal distribution at 5% significance level. Finally, the propagation models from the two buildings are compared to validate the ...