Date: April 1979
Creator: McDaniel, Floyd Del. (Floyd Delbert), 1942-; Toten, R. S.; Peterson, J. L.; Duggan, Jerome L.; Wilson, Scott R.; Gressett, J. D. et al.
Description: This article discusses projectile-charge-state dependence of target L-shell ionization by 1.86-MeV/amu and silicon ions and 1.8-MeV/amu chlorine ions. Lα x-ray-production cross sections have been measured for solid targets of ₆₀Nd, ₆₇Ho, and ₇₉Au for 1.86-MeV/amu ₉¹⁹F and ₁₄²⁸Si, and 1.8-MeV/amu ₁₇³⁵Cl ions as a function of the incident charge state. From the projectile-charge-state dependence of the cross sections, both direct-ionization and electron-capture contributions were extracted for a comparison to Coulomb ionization theories. The data provide supporting evidence for the theory of electron capture with a reduced binding effect. With standard fluorescence and Coster-Kronig yields uncorrected for multiple-ionization effects, the direct ionization theories did not simultaneously reproduce the projectile-Z₁ and target-Z₂ dependences of the data.
Contributing Partner: UNT College of Arts and Sciences