Date: October 1977
Creator: McDaniel, Floyd Del. (Floyd Delbert), 1942-; Duggan, Jerome L.; Basbas, George; Miller, P. D. & Lapicki, Gregory
Description: This article discusses projectile charge-state dependence of K-shell ionization by silicon ions. X-ray production cross sections measured in K-shell ionization of ₂₁Sc, ₂₂Ti, ₂₉Cu, and ₃₂Ge by 52-MeV ₁₄²⁸Si(+q) projectiles with q=7 to 14 are reported, which demonstrate, through their charge-state dependence, the validity of a recently developed electron-capture theory with a reduced binding effect. Furthermore, the data provide evidence for the applicability of the perturbed stationary-state theory of direct ionization for values of 0.44 ≤ Z₁/Z₂ ≤ 0.67.
Contributing Partner: UNT College of Arts and Sciences